Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information		 Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2007-07-13 15:20
Stochastic Differential Equation Modeling Considering Fault Importance Levels for Open Source Software
Yoshinobu Tamura (HIT), Shigeru Yamada (Tottori Univ.) R2007-27
Abstract (in Japanese) (See Japanese page) 
(in English) Network technologies become increasingly more complex in a wide sphere. In accordance with such a penetration of the Internet, it is increasing public awareness of the importance of online real-time and interactive functions. Especially, OSS (Open Source Software) systems which serve as key components of critical infrastructures in the society are still ever-expanding now. This paper focuses on an open source software system developed under the open source project. We propose a software reliability growth model based on stochastic differential equations in order to consider the active state of the open source project. Especially, we assume that the software failure intensity depends on the time, and the software fault-report phenomena on the bug tracking system keep an irregular state in terms of the number of detected faults. Moreover, we assume that the software failure intensity depends on the fault importance levels. Also, we analyze actual software fault-count data by using the proposed model to show numerical examples of software reliability assessment for the OSS.
Keyword (in Japanese) (See Japanese page) 
(in English) Open source software / Reliability assessment / Fault importance level / Stochastic differential equations / Software reliability growth model / / /  
Reference Info. IEICE Tech. Rep., vol. 107, no. 137, R2007-27, pp. 45-50, July 2007.
Paper # R2007-27 
Date of Issue 2007-07-06 (R) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF R2007-27

Conference Information
Committee R  
Conference Date 2007-07-13 - 2007-07-13 
Place (in Japanese) (See Japanese page) 
Place (in English) Kitami Institute of Technology 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Reliability Engineering 
Paper Information
Registration To R 
Conference Code 2007-07-R 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Stochastic Differential Equation Modeling Considering Fault Importance Levels for Open Source Software 
Sub Title (in English)  
Keyword(1) Open source software  
Keyword(2) Reliability assessment  
Keyword(3) Fault importance level  
Keyword(4) Stochastic differential equations  
Keyword(5) Software reliability growth model  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Yoshinobu Tamura  
1st Author's Affiliation Hiroshima Institute of Technology (HIT)
2nd Author's Name Shigeru Yamada  
2nd Author's Affiliation Tottori University (Tottori Univ.)
3rd Author's Name  
3rd Author's Affiliation ()
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2007-07-13 15:20:00 
Presentation Time 25 minutes 
Registration for R 
Paper # R2007-27 
Volume (vol) vol.107 
Number (no) no.137 
Page pp.45-50 
#Pages 6 
Date of Issue 2007-07-06 (R) 

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan