Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2007-09-14 14:05
Evaluation of transmission line for LSI tester and simulation modeling
Hidekazu Tsuchiya, Takeshi Asakawa (Tokai univ.), Masayuki Sato (Genesis technology) R2007-34
Abstract (in Japanese) (See Japanese page) 
(in English) Recently, the operating speed of LSI is more fast. Therefore, it is more important to evaluate the transmission line of between LSI tester and LSI. Analog simulation is a better way for the evaluation about transmission line. However, we are difficult to get the models of LSI tester-hardware from tester makers. Then we evaluated the transmission line for LSI tester and compared Shmoo plots with simulation ones. The results shown that amount of information can be reduced for simulation.
Keyword (in Japanese) (See Japanese page) 
(in English) LSI tester / Transmission Line / Simulation / Model / / / /  
Reference Info. IEICE Tech. Rep., vol. 107, no. 213, R2007-34, pp. 29-34, Sept. 2007.
Paper # R2007-34 
Date of Issue 2007-09-07 (R) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF R2007-34

Conference Information
Committee R  
Conference Date 2007-09-14 - 2007-09-14 
Place (in Japanese) (See Japanese page) 
Place (in English) Kochi Univ. of Technology 
Topics (in Japanese) (See Japanese page) 
Topics (in English) For LSI, evaluation, fault diagnosis, physical analysis and quality 
Paper Information
Registration To R 
Conference Code 2007-09-R 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Evaluation of transmission line for LSI tester and simulation modeling 
Sub Title (in English)  
Keyword(1) LSI tester  
Keyword(2) Transmission Line  
Keyword(3) Simulation  
Keyword(4) Model  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Hidekazu Tsuchiya  
1st Author's Affiliation Tokai University (Tokai univ.)
2nd Author's Name Takeshi Asakawa  
2nd Author's Affiliation Tokai University (Tokai univ.)
3rd Author's Name Masayuki Sato  
3rd Author's Affiliation Genesis technology incorporated (Genesis technology)
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2007-09-14 14:05:00 
Presentation Time 25 minutes 
Registration for R 
Paper # R2007-34 
Volume (vol) vol.107 
Number (no) no.213 
Page pp.29-34 
#Pages
Date of Issue 2007-09-07 (R) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan