| Paper Abstract and Keywords |
| Presentation |
2007-10-31 14:15
The Analysis of MOSFET Characteristic Fluctuation Caused by Layout Variation Kunio Anzai, Hitoshi Tsuno, Masao Matsumura, Satoe Minami, Yohei Hiura, Akira Takeo, Fu Wingsze, Yuzo Fukuzaki, Michihiro Kanno, Naoki Nagashima, Hisahiro Ansai (Sony) VLD2007-66 SDM2007-210 |
| Abstract |
(in Japanese) |
(See Japanese page) |
| (in English) |
(Not available yet) |
| Keyword |
(in Japanese) |
(See Japanese page) |
| (in English) |
/ / / / / / / |
| Reference Info. |
IEICE Tech. Rep., vol. 107, no. 298, SDM2007-210, pp. 31-34, Oct. 2007. |
| Paper # |
SDM2007-210 |
| Date of Issue |
2007-10-24 (VLD, SDM) |
| ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
| Download PDF |
VLD2007-66 SDM2007-210 |
| Conference Information |
| Committee |
SDM VLD |
| Conference Date |
2007-10-30 - 2007-10-31 |
| Place (in Japanese) |
(See Japanese page) |
| Place (in English) |
Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) |
(See Japanese page) |
| Topics (in English) |
Process, Device, Circuit Simulation, etc. |
| Paper Information |
| Registration To |
SDM |
| Conference Code |
2007-10-SDM-VLD |
| Language |
Japanese |
| Title (in Japanese) |
(See Japanese page) |
| Sub Title (in Japanese) |
(See Japanese page) |
| Title (in English) |
The Analysis of MOSFET Characteristic Fluctuation Caused by Layout Variation |
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| 1st Author's Name |
Kunio Anzai |
| 1st Author's Affiliation |
Sony Corporation (Sony) |
| 2nd Author's Name |
Hitoshi Tsuno |
| 2nd Author's Affiliation |
Sony Corporation (Sony) |
| 3rd Author's Name |
Masao Matsumura |
| 3rd Author's Affiliation |
Sony Corporation (Sony) |
| 4th Author's Name |
Satoe Minami |
| 4th Author's Affiliation |
Sony Corporation (Sony) |
| 5th Author's Name |
Yohei Hiura |
| 5th Author's Affiliation |
Sony Corporation (Sony) |
| 6th Author's Name |
Akira Takeo |
| 6th Author's Affiliation |
Sony Corporation (Sony) |
| 7th Author's Name |
Fu Wingsze |
| 7th Author's Affiliation |
Sony Corporation (Sony) |
| 8th Author's Name |
Yuzo Fukuzaki |
| 8th Author's Affiliation |
Sony Corporation (Sony) |
| 9th Author's Name |
Michihiro Kanno |
| 9th Author's Affiliation |
Sony Corporation (Sony) |
| 10th Author's Name |
Naoki Nagashima |
| 10th Author's Affiliation |
Sony Corporation (Sony) |
| 11th Author's Name |
Hisahiro Ansai |
| 11th Author's Affiliation |
Sony Corporation (Sony) |
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| Speaker |
Author-1 |
| Date Time |
2007-10-31 14:15:00 |
| Presentation Time |
25 minutes |
| Registration for |
SDM |
| Paper # |
VLD2007-66, SDM2007-210 |
| Volume (vol) |
vol.107 |
| Number (no) |
no.296(VLD), no.298(SDM) |
| Page |
pp.31-34 |
| #Pages |
4 |
| Date of Issue |
2007-10-24 (VLD, SDM) |