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Paper Abstract and Keywords
Presentation 2007-11-15 10:25
Contact Resistance Characteristics of Complex Structure Contacts for Contaminated Printed Circuit Board in SO2 Environment
Terutaka Tamai, Yasushi Saitoh (Mie Univ.), Yasuhiro Hattori (AutoNetwork Technologies) EMD2007-87
Abstract (in Japanese) (See Japanese page) 
(in English) Characteristics of conductive elastomer which is composed of silicone rubber and dispersed carbon black particles shows conductive and elastic properties in one simple material. This material has been widely applied to connectors of liquid crystal panels and contacts of switches. However, since surface state of the contact is very soft, it is difficult to remove contaminant films of contaminated opposite side contact surface and to obtain low contact resistance owing to break the film. This study has been conducted to clear structures of the elastomer which indicates removal characteristics for contaminant films and low contact resistance. As specimens, six different types of the elstomer contacts composed by different type of dispersed such materials as carbon and metal fibers, metal mesh, and plated surfaces were used. The contacts of opposite side were Au and Sn plated contact surface on a printed circuit board (PCB). In order to contaminate contact surfaces of PCB, its surface were subjected to expose SO2 gas environment. The elastomeric contacts contained hard materials showed lower contact resistance than only dispersed carbon particles in the elastomer matrix for both contaminated PCB contact surfaces.
Keyword (in Japanese) (See Japanese page) 
(in English) silicone rubber / elasmeric contactst / contact failure / Printed Circuit Board / contact resistance / / /  
Reference Info. IEICE Tech. Rep., vol. 107, no. 309, EMD2007-87, pp. 109-114, Nov. 2007.
Paper # EMD2007-87 
Date of Issue 2007-11-07 (EMD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee EMD  
Conference Date 2007-11-14 - 2007-11-15 
Place (in Japanese) (See Japanese page) 
Place (in English) Actcity Hamamatsu 
Topics (in Japanese) (See Japanese page) 
Topics (in English) International Session on Electro-Mechanical Devices 2007 
Paper Information
Registration To EMD 
Conference Code 2007-11-EMD 
Language English (Japanese title is available) 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Contact Resistance Characteristics of Complex Structure Contacts for Contaminated Printed Circuit Board in SO2 Environment 
Sub Title (in English)  
Keyword(1) silicone rubber  
Keyword(2) elasmeric contactst  
Keyword(3) contact failure  
Keyword(4) Printed Circuit Board  
Keyword(5) contact resistance  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Terutaka Tamai  
1st Author's Affiliation Mie University (Mie Univ.)
2nd Author's Name Yasushi Saitoh  
2nd Author's Affiliation Mie University (Mie Univ.)
3rd Author's Name Yasuhiro Hattori  
3rd Author's Affiliation AutoNetworks Technology, Ltd (AutoNetwork Technologies)
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Speaker Author-1 
Date Time 2007-11-15 10:25:00 
Presentation Time 20 minutes 
Registration for EMD 
Paper # EMD2007-87 
Volume (vol) vol.107 
Number (no) no.309 
Page pp.109-114 
#Pages 6 
Date of Issue 2007-11-07 (EMD) 

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