Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information		 Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2007-11-16 10:35
Study on the boundary effect in SAR measurement and probe calibration
Lira Hamada (NICT), Atushi Tanaka (UEC), Ken-ichi Sato (NTT-AT), Soichi Watanabe, Yukio Yamanaka (NICT), Takashi Iwasaki (UEC) EMCJ2007-87
Abstract (in Japanese) (See Japanese page) 
(in English) Since 2002, measurement of the SAR (Specific Absorption Rate) has been obligated in compliance test for mobile communication device. Here, the uncertainty caused by the boundary effect in the probe calibration setup and the SAR measurement setup was examined using the FDTD computation. As a result, the influence of the boundary effect in the probe calibration setup was larger than that in the other setup. This result shows a possibility of over-estimation of the uncertainty.
Keyword (in Japanese) (See Japanese page) 
(in English) Specific Absorption Rate / boundary effect / SAR measurement / SAR probe calibration / uncertainty / / /  
Reference Info. IEICE Tech. Rep., vol. 107, no. 310, EMCJ2007-87, pp. 37-40, Nov. 2007.
Paper # EMCJ2007-87 
Date of Issue 2007-11-08 (EMCJ) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMCJ2007-87

Conference Information
Committee EMCJ  
Conference Date 2007-11-15 - 2007-11-16 
Place (in Japanese) (See Japanese page) 
Place (in English) Tokyo Instutute of Technology 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EMCJ 
Conference Code 2007-11-EMCJ 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Study on the boundary effect in SAR measurement and probe calibration 
Sub Title (in English)  
Keyword(1) Specific Absorption Rate  
Keyword(2) boundary effect  
Keyword(3) SAR measurement  
Keyword(4) SAR probe calibration  
Keyword(5) uncertainty  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Lira Hamada  
1st Author's Affiliation NICT (NICT)
2nd Author's Name Atushi Tanaka  
2nd Author's Affiliation University of Electro-Communications (UEC)
3rd Author's Name Ken-ichi Sato  
3rd Author's Affiliation NTT Advanced Technology Co. (NTT-AT)
4th Author's Name Soichi Watanabe  
4th Author's Affiliation NICT (NICT)
5th Author's Name Yukio Yamanaka  
5th Author's Affiliation NICT (NICT)
6th Author's Name Takashi Iwasaki  
6th Author's Affiliation University of Electro-Communications (UEC)
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2007-11-16 10:35:00 
Presentation Time 25 minutes 
Registration for EMCJ 
Paper # EMCJ2007-87 
Volume (vol) vol.107 
Number (no) no.310 
Page pp.37-40 
#Pages 4 
Date of Issue 2007-11-08 (EMCJ) 

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan