Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information		 Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2007-11-21 14:20
Clone resistance in artifact-metric systems
Yuko Tamura, Masashi Une (BOJ) ISEC2007-91 OIS2007-63
Abstract (in Japanese) (See Japanese page) 
(in English) Artifact-metrics is a technique to authenticate an artifact by using its physical feature that even the manufacturer can hardly control, and can be used as a counterfeit deterrence in the artifact. Such a security characteristic is called ``clone resistance,'' and has been evaluated in several artifact-metric systems previously proposed. However, previous results of the clone resistance evaluation have open problems. For instance, it is difficult to compare the evaluation results because objectives of the evaluation are different. In this paper, we clarify these problems and show items to be discussed for the development of a useful evaluation method. Concretely, we divide each of five known attacks against an artifact-metric system into four actions and examine
the feasibility in each of the actions. Furthermore, we present future research topics to improve an evaluation method for the clone resistance.
Keyword (in Japanese) (See Japanese page) 
(in English) artifact-metrics / authentication / clone resistance / counterfeit deterrence / evaluation measure / / /  
Reference Info. IEICE Tech. Rep., vol. 107, no. 345, ISEC2007-91, pp. 15-22, Nov. 2007.
Paper # ISEC2007-91 
Date of Issue 2007-11-14 (ISEC, OIS) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ISEC2007-91 OIS2007-63

Conference Information
Committee ISEC LOIS  
Conference Date 2007-11-21 - 2007-11-22 
Place (in Japanese) (See Japanese page) 
Place (in English) Kobe University 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To ISEC 
Conference Code 2007-11-ISEC-OIS 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Clone resistance in artifact-metric systems 
Sub Title (in English) * 
Keyword(1) artifact-metrics  
Keyword(2) authentication  
Keyword(3) clone resistance  
Keyword(4) counterfeit deterrence  
Keyword(5) evaluation measure  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Yuko Tamura  
1st Author's Affiliation Bank of Japan (BOJ)
2nd Author's Name Masashi Une  
2nd Author's Affiliation Bank of Japan (BOJ)
3rd Author's Name  
3rd Author's Affiliation ()
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2007-11-21 14:20:00 
Presentation Time 25 minutes 
Registration for ISEC 
Paper # ISEC2007-91, OIS2007-63 
Volume (vol) vol.107 
Number (no) no.345(ISEC), no.347(OIS) 
Page pp.15-22 
#Pages 8 
Date of Issue 2007-11-14 (ISEC, OIS) 

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan