Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information		 Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2007-12-18 09:00
Integration Test Environment of Web Application
Asako Katayama, Tadahiro Uehara, Toshihiro Kodaka, Yuka Tanaka, Kyoko Ohashi, Rieko Yamamoto (Fujitsu Lab.) SS2007-51
Abstract (in Japanese) (See Japanese page) 
(in English) In this paper, we propose Aptester, which is an integrated test management tool especially for web applications. Aptester semi-automatically creates test cases according to test models derived from application specifications. It also supports the test process by executing the tests and managing their results. We applied Aptester on a real business application and achieve a good result on both improving application quality and reducing testing cost.
Keyword (in Japanese) (See Japanese page) 
(in English) Test Environment / Web Application / Integration Test / Model / / / /  
Reference Info. IEICE Tech. Rep., vol. 107, no. 392, SS2007-51, pp. 79-84, Dec. 2007.
Paper # SS2007-51 
Date of Issue 2007-12-10 (SS) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF SS2007-51

Conference Information
Committee SS  
Conference Date 2007-12-17 - 2007-12-18 
Place (in Japanese) (See Japanese page) 
Place (in English) Shimane Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) general 
Paper Information
Registration To SS 
Conference Code 2007-12-SS 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Integration Test Environment of Web Application 
Sub Title (in English)  
Keyword(1) Test Environment  
Keyword(2) Web Application  
Keyword(3) Integration Test  
Keyword(4) Model  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Asako Katayama  
1st Author's Affiliation Fujitsu Laboratories LTD. (Fujitsu Lab.)
2nd Author's Name Tadahiro Uehara  
2nd Author's Affiliation Fujitsu Laboratories LTD. (Fujitsu Lab.)
3rd Author's Name Toshihiro Kodaka  
3rd Author's Affiliation Fujitsu Laboratories LTD. (Fujitsu Lab.)
4th Author's Name Yuka Tanaka  
4th Author's Affiliation Fujitsu Laboratories LTD. (Fujitsu Lab.)
5th Author's Name Kyoko Ohashi  
5th Author's Affiliation Fujitsu Laboratories LTD. (Fujitsu Lab.)
6th Author's Name Rieko Yamamoto  
6th Author's Affiliation Fujitsu Laboratories LTD. (Fujitsu Lab.)
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2007-12-18 09:00:00 
Presentation Time 30 minutes 
Registration for SS 
Paper # SS2007-51 
Volume (vol) vol.107 
Number (no) no.392 
Page pp.79-84 
#Pages 6 
Date of Issue 2007-12-10 (SS) 

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan