Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information		 Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2008-01-25 14:00
An evaluation of the measurement method for Fully Anechoic Room
Hiroyoshi Tagi, Yoshiyuki Saito, Yukihiro Fukumoto, Takuya Nakamori, Masataka Inoue, Katsuo Ishihara (MEI) EMCJ2007-111
Abstract (in Japanese) (See Japanese page) 
(in English) According to the current standards of EMC, the radiated emission level is measured as the electric field strength of synthesized-vector-wave. The wave is composed of the direct wave from equipment under test (EUT) and the reflected wave from the floor. On the other hand, it is being discussed to use a fully anechoic room (FAR) in a new EMC standard: CISPR 32. In a FAR, the variation of the height pattern occurs little because there is no reflected wave from the floor. Therefore, the measurement time can be reduced drastically, since the height of the antenna does not need to be changed. However, there is a concern that an accurate peak value cannot be obtained at the fixed-height antenna, since an EUT may have an directional characteristics. In this report, we evaluated the relation between the height of the antenna and the measurement result by using a comb generator and some digital consumer electronics equipments. As a result, we verified that there was no problem in this evaluation method even if the height of the antenna is fixed. Additionally, it was shown that we could shorten the measurement time to about one sixth of the conventional method, by fixed-height antenna in the FAR.
Keyword (in Japanese) (See Japanese page) 
(in English) Anechoic room / FAR / OATS / SAC / EMI / CISPR / /  
Reference Info. IEICE Tech. Rep., vol. 107, no. 456, EMCJ2007-111, pp. 31-36, Jan. 2008.
Paper # EMCJ2007-111 
Date of Issue 2008-01-18 (EMCJ) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMCJ2007-111

Conference Information
Committee EMCJ  
Conference Date 2008-01-25 - 2008-01-25 
Place (in Japanese) (See Japanese page) 
Place (in English) Saga University 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EMCJ 
Conference Code 2008-01-EMCJ 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) An evaluation of the measurement method for Fully Anechoic Room 
Sub Title (in English)  
Keyword(1) Anechoic room  
Keyword(2) FAR  
Keyword(3) OATS  
Keyword(4) SAC  
Keyword(5) EMI  
Keyword(6) CISPR  
Keyword(7)  
Keyword(8)  
1st Author's Name Hiroyoshi Tagi  
1st Author's Affiliation Matsushita Electric Industrial Co.,Ltd (MEI)
2nd Author's Name Yoshiyuki Saito  
2nd Author's Affiliation Matsushita Electric Industrial Co.,Ltd (MEI)
3rd Author's Name Yukihiro Fukumoto  
3rd Author's Affiliation Matsushita Electric Industrial Co.,Ltd (MEI)
4th Author's Name Takuya Nakamori  
4th Author's Affiliation Matsushita Electric Industrial Co.,Ltd (MEI)
5th Author's Name Masataka Inoue  
5th Author's Affiliation Matsushita Electric Industrial Co.,Ltd (MEI)
6th Author's Name Katsuo Ishihara  
6th Author's Affiliation Matsushita Electric Industrial Co.,Ltd (MEI)
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-2 
Date Time 2008-01-25 14:00:00 
Presentation Time 25 minutes 
Registration for EMCJ 
Paper # EMCJ2007-111 
Volume (vol) vol.107 
Number (no) no.456 
Page pp.31-36 
#Pages 6 
Date of Issue 2008-01-18 (EMCJ) 

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan