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Paper Abstract and Keywords
Presentation 2008-01-25 14:00
Degradation phenomenon of electrical contacts by hammering oscillating mechanism -- experimental data and discussions --
Shin-ichi Wada, Taketo Sonoda, Hiroshi Amao, Hiroto Minegishi, Keiji Koshida, Mitsuo Kikuchi, Hiroaki Kubota (TMC), Koichiro Sawa, Kei Koga, Ryo Nishioka (Keio Univ.) EMD2007-110
Abstract (in Japanese) (See Japanese page) 
(in English) We have developed the mechanism which gives vibration to electrical contacts by hammering and studied the influences of a micro-oscillating on contact resistance. Over 7.5 millions of hammering, the resistance almost was 200Ω. And over 17 millions of hammering, it fluctuated between 200Ω and 1000Ω. By 45 millions of hammering it was almost 1000Ω.On the other hand, we also developed the mechanism which gives micro-sliding to electrical contacts for comparison. This mechanism could detect the degradation phenomenon on these by influences of repeated sliding operations. Over 100 thousand of sliding, the resistance of the contacts started increasing, and after that the resistance fluctuated in between 20Ω and 400Ω. Although the two mechanisms are completely different( in methods, numbers, etc ), the results of two tests were almost similar on the oscillating phenomenon.
Keyword (in Japanese) (See Japanese page) 
(in English) electrical contact / oscillating mechanism / micro-oscillation / contact resistance / sliding contact / sliding mechanism / /  
Reference Info. IEICE Tech. Rep., vol. 107, no. 457, EMD2007-110, pp. 7-12, Jan. 2008.
Paper # EMD2007-110 
Date of Issue 2008-01-18 (EMD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee EMD  
Conference Date 2008-01-25 - 2008-01-25 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EMD 
Conference Code 2008-01-EMD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Degradation phenomenon of electrical contacts by hammering oscillating mechanism 
Sub Title (in English) experimental data and discussions 
Keyword(1) electrical contact  
Keyword(2) oscillating mechanism  
Keyword(3) micro-oscillation  
Keyword(4) contact resistance  
Keyword(5) sliding contact  
Keyword(6) sliding mechanism  
Keyword(7)  
Keyword(8)  
1st Author's Name Shin-ichi Wada  
1st Author's Affiliation TMC SYSTEM CO., LTD. (TMC)
2nd Author's Name Taketo Sonoda  
2nd Author's Affiliation TMC SYSTEM CO., LTD. (TMC)
3rd Author's Name Hiroshi Amao  
3rd Author's Affiliation TMC SYSTEM CO., LTD. (TMC)
4th Author's Name Hiroto Minegishi  
4th Author's Affiliation TMC SYSTEM CO., LTD. (TMC)
5th Author's Name Keiji Koshida  
5th Author's Affiliation TMC SYSTEM CO., LTD. (TMC)
6th Author's Name Mitsuo Kikuchi  
6th Author's Affiliation TMC SYSTEM CO., LTD. (TMC)
7th Author's Name Hiroaki Kubota  
7th Author's Affiliation TMC SYSTEM CO., LTD. (TMC)
8th Author's Name Koichiro Sawa  
8th Author's Affiliation Keio University (Keio Univ.)
9th Author's Name Kei Koga  
9th Author's Affiliation Keio University (Keio Univ.)
10th Author's Name Ryo Nishioka  
10th Author's Affiliation Keio University (Keio Univ.)
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Speaker Author-1 
Date Time 2008-01-25 14:00:00 
Presentation Time 25 minutes 
Registration for EMD 
Paper # EMD2007-110 
Volume (vol) vol.107 
Number (no) no.457 
Page pp.7-12 
#Pages
Date of Issue 2008-01-18 (EMD) 


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