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Paper Abstract and Keywords
Presentation 2008-01-25 15:00
A study of the placement of common-mode points in the WBFC method for EM-immunity test
Naoki Kagawa (Fukuyama Univ.) EMCJ2007-113
Abstract (in Japanese) (See Japanese page) 
(in English) To find the optimum measurement condition of the immunity test with the workbench faraday cage (WBFC) method, the author examined the shape, the arrangement, the scale of the test substrate, and the number of the supplying points of the common-mode noise, so-called common-mode points. According to the relation between analytical, measurement results of the input impedance of the WBFC and the characteristic impedance of the transmission line, the substrate with all sides 20mm was the best test object. For large-scale substrate, addition of the common-mode point supplied better impedance matching for the transmission lines. As the result, in case of 100mmx100mm substrate, four common-mode points, one input point and three terminators, matched best the transmission lines. On the other hand, two common-mode points including one input point and one terminator supplied the current all over the substrate.
Keyword (in Japanese) (See Japanese page) 
(in English) WBFC method / common-mode / immunity / integrated circuits / / / /  
Reference Info. IEICE Tech. Rep., vol. 107, no. 456, EMCJ2007-113, pp. 43-48, Jan. 2008.
Paper # EMCJ2007-113 
Date of Issue 2008-01-18 (EMCJ) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee EMCJ  
Conference Date 2008-01-25 - 2008-01-25 
Place (in Japanese) (See Japanese page) 
Place (in English) Saga University 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EMCJ 
Conference Code 2008-01-EMCJ 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A study of the placement of common-mode points in the WBFC method for EM-immunity test 
Sub Title (in English)  
Keyword(1) WBFC method  
Keyword(2) common-mode  
Keyword(3) immunity  
Keyword(4) integrated circuits  
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1st Author's Name Naoki Kagawa  
1st Author's Affiliation Fukuyama University (Fukuyama Univ.)
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Speaker Author-1 
Date Time 2008-01-25 15:00:00 
Presentation Time 25 minutes 
Registration for EMCJ 
Paper # EMCJ2007-113 
Volume (vol) vol.107 
Number (no) no.456 
Page pp.43-48 
#Pages 6 
Date of Issue 2008-01-18 (EMCJ) 

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