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Paper Abstract and Keywords
Presentation 2008-02-08 09:25
Fault Diagnosis for Dyinamic Open Faults with Considering Adjacent Lines
Hiroshi Takahashi, Yoshinobu Higami, Takashi Aikyo, Syuhei Kadoyama, Tetsuya Watanabe, Yuzo Takamatsu (Ehime Univ.), Toshiyuki Tsutsumi, Kouji Yamazaki (Meiji Univ.), Hiroyuki Yotsuyanagi, Masaki Hashizume (Univ. of Tokushima) DC2007-68
Abstract (in Japanese) (See Japanese page) 
(in English) In modern manufacturing technologies with the shrinking of manufacturing process, LSIs may have several metal interconnect layers and the long copper(Cu) interconnect wires.
Under the modern manufacturing technologies, the open defect is the one of the significant issues to maintain the reliability of LSI.
In this paper, we propose a dynamic open fault model with considering the affects of the adjacent lines. Under the open fault model, the fault is excited depending on the signal transitions at the adjacent lines that are assigned by the pair of test patterns. Next, we propose the diagnosis method based on the dynamic open fault model. The proposed method uses not only fail test patterns but also the pass test patterns. Base on results of the diagnostic fault simulation, the candidate faults are ranked. Experimental results show that the proposed method is able to diagnose the open faults.
Keyword (in Japanese) (See Japanese page) 
(in English) open faults / fault diagnosis / fail test patteren / pass test pattern / diagnostic fault simulation / / /  
Reference Info. IEICE Tech. Rep., vol. 107, no. 482, DC2007-68, pp. 7-12, Feb. 2008.
Paper # DC2007-68 
Date of Issue 2008-02-01 (DC) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee DC  
Conference Date 2008-02-08 - 2008-02-08 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To DC 
Conference Code 2008-02-DC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Fault Diagnosis for Dyinamic Open Faults with Considering Adjacent Lines 
Sub Title (in English)  
Keyword(1) open faults  
Keyword(2) fault diagnosis  
Keyword(3) fail test patteren  
Keyword(4) pass test pattern  
Keyword(5) diagnostic fault simulation  
Keyword(6)  
Keyword(7)  
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1st Author's Name Hiroshi Takahashi  
1st Author's Affiliation Ehime University (Ehime Univ.)
2nd Author's Name Yoshinobu Higami  
2nd Author's Affiliation Ehime University (Ehime Univ.)
3rd Author's Name Takashi Aikyo  
3rd Author's Affiliation Ehime University (Ehime Univ.)
4th Author's Name Syuhei Kadoyama  
4th Author's Affiliation Ehime University (Ehime Univ.)
5th Author's Name Tetsuya Watanabe  
5th Author's Affiliation Ehime University (Ehime Univ.)
6th Author's Name Yuzo Takamatsu  
6th Author's Affiliation Ehime University (Ehime Univ.)
7th Author's Name Toshiyuki Tsutsumi  
7th Author's Affiliation Meiji University (Meiji Univ.)
8th Author's Name Kouji Yamazaki  
8th Author's Affiliation Meiji University (Meiji Univ.)
9th Author's Name Hiroyuki Yotsuyanagi  
9th Author's Affiliation Univeresity of Tokushima (Univ. of Tokushima)
10th Author's Name Masaki Hashizume  
10th Author's Affiliation Univeresity of Tokushima (Univ. of Tokushima)
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Speaker Author-5 
Date Time 2008-02-08 09:25:00 
Presentation Time 25 minutes 
Registration for DC 
Paper # DC2007-68 
Volume (vol) vol.107 
Number (no) no.482 
Page pp.7-12 
#Pages 6 
Date of Issue 2008-02-01 (DC) 

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