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Paper Abstract and Keywords
Presentation 2008-04-18 13:35
Degradation phenomenon of electrical contacts by hammering oscillating mechanism -- modeling of the oscillating mechanism --
Shin-ichi Wada, Keiji Koshida, Hiroto Minegishi, Hiroshi Amao, Taketo Sonoda, Mitsuo Kikuchi, Hiroaki Kubota (TMC), Koichiro Sawa (Keio Univ.) EMD2008-1
Abstract (in Japanese) (See Japanese page) 
(in English) We have developed the mechanism which gives vibration to electrical contacts by hammering oscillation and studied the influences of a micro-oscillating on the contacts. By means of a mathematical modeling of the oscillating mechanism, the dyanamical characteristics of the mechanism was simulated with a personal computer (PC). By making use of this model, it was studied to estimate approximately a fundamental mechanical quantities such as a displacement, an acceleration, and a mechanical energy. On the other hand, by FEM, such as a geometry element method, the hammring oscillating motion was simulated. The simulated data was in agreement with the measured ones to the degree with the exeption of a motion near the fixed points on the board and of the absolute values of a displacement and an acceleration.
Keyword (in Japanese) (See Japanese page) 
(in English) electrical contact / oscillating mechanism / mathematical model / simulation / finite element method (FEM) / / /  
Reference Info. IEICE Tech. Rep., vol. 108, no. 10, EMD2008-1, pp. 1-6, April 2008.
Paper # EMD2008-1 
Date of Issue 2008-04-11 (EMD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee EMD  
Conference Date 2008-04-18 - 2008-04-18 
Place (in Japanese) (See Japanese page) 
Place (in English) NTT Musashino Research and Development Center 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EMD 
Conference Code 2008-04-EMD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Degradation phenomenon of electrical contacts by hammering oscillating mechanism 
Sub Title (in English) modeling of the oscillating mechanism 
Keyword(1) electrical contact  
Keyword(2) oscillating mechanism  
Keyword(3) mathematical model  
Keyword(4) simulation  
Keyword(5) finite element method (FEM)  
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1st Author's Name Shin-ichi Wada  
1st Author's Affiliation TMC SYSTEM CO., LTD. (TMC)
2nd Author's Name Keiji Koshida  
2nd Author's Affiliation TMC SYSTEM CO., LTD. (TMC)
3rd Author's Name Hiroto Minegishi  
3rd Author's Affiliation TMC SYSTEM CO., LTD. (TMC)
4th Author's Name Hiroshi Amao  
4th Author's Affiliation TMC SYSTEM CO., LTD. (TMC)
5th Author's Name Taketo Sonoda  
5th Author's Affiliation TMC SYSTEM CO., LTD. (TMC)
6th Author's Name Mitsuo Kikuchi  
6th Author's Affiliation TMC SYSTEM CO., LTD. (TMC)
7th Author's Name Hiroaki Kubota  
7th Author's Affiliation TMC SYSTEM CO., LTD. (TMC)
8th Author's Name Koichiro Sawa  
8th Author's Affiliation Keio University (Keio Univ.)
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Speaker Author-1 
Date Time 2008-04-18 13:35:00 
Presentation Time 25 minutes 
Registration for EMD 
Paper # EMD2008-1 
Volume (vol) vol.108 
Number (no) no.10 
Page pp.1-6 
#Pages 6 
Date of Issue 2008-04-11 (EMD) 

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