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| Presentation | 2008-04-18 14:50 A study on contact spots of the relays used for earthquake disasters by Surface Potential Microscopy Yoshitada Watanabe, Yuichi Hirakawa (Kogakuin Univ.)  EMD2008-4 Link to ES Tech. Rep. Archives: EMD2008-4 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | Abstract This paper reports on the effect of switching action on the contact surfaces of earthquake disaster prevention relays. Large-scale earthquakes occur frequently in Japan bringing with them extensive damage, and fire caused by electrical equipment is one example of the serious damage which can occur. Earthquake sensors capable of maintaining a high level of reliability when earthquakes occur play an important role as a means of minimizing this damage. The contact spots of sensor were then viewed using an atomic force microscope (AFM) in tapping mode and a surface potential microscope (SPoM). As a result, we discovered that even the unused earthquake disaster prevention relay (standard sample) which had a surface lined with asperities on its parallel striations developed irregular protrusions due to dust and other deposits. In addition, scanning the contact surface with the SPoM at the same potential revealed the occurrence of differences in surface potential which varied in response to the asperities on the striations. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | earthquake disasterprevention relay / contact resistance / atomic force microscope / surface potential / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 108, no. 10, EMD2008-4, pp. 17-22, April 2008. | |
| Paper # | EMD2008-4 | |
| Date of Issue | 2008-04-11 (EMD) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | EMD2008-4 Link to ES Tech. Rep. Archives: EMD2008-4 |
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| Conference Information | |
| Committee | EMD |
| Conference Date | 2008-04-18 - 2008-04-18 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | NTT Musashino Research and Development Center |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | EMD |
| Conference Code | 2008-04-EMD |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A study on contact spots of the relays used for earthquake disasters by Surface Potential Microscopy |
| Sub Title (in English) | |
| Keyword(1) | earthquake disasterprevention relay |
| Keyword(2) | contact resistance |
| Keyword(3) | atomic force microscope |
| Keyword(4) | surface potential |
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| 1st Author's Name | Yoshitada Watanabe |
| 1st Author's Affiliation | Kogakuin University (Kogakuin Univ.) |
| 2nd Author's Name | Yuichi Hirakawa |
| 2nd Author's Affiliation | Kogakuin University (Kogakuin Univ.) |
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| Speaker | Author-1 |
| Date Time | 2008-04-18 14:50:00 |
| Presentation Time | 25 minutes |
| Registration for | EMD |
| Paper # | EMD2008-4 |
| Volume (vol) | vol.108 |
| Number (no) | no.10 |
| Page | pp.17-22 |
| #Pages | 6 |
| Date of Issue | 2008-04-11 (EMD) |
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