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Paper Abstract and Keywords
Presentation 2008-04-18 10:00
A 65nm Pure CMOS One-time Programmable Memory Using a Two-Port Antifuse Cell Implemented in a Matrix Structure
Kensuke Matsufuji, Toshimasa Namekawa, Hiroaki Nakano, Hiroshi Ito, Osamu Wada, Nobuaki Otsuka (Toshiba) ICD2008-8 Link to ES Tech. Rep. Archives: ICD2008-8
Abstract (in Japanese) (See Japanese page) 
(in English) A Pure CMOS One-time Programmable(PCOP)memory using an antifuse is presented. PCOP memory adopts two-port cell architecture implemented in a matrix structure. This architecture achieves optimization of performance both for programming and reading. Furthermore, it solves the write disturb problem and realizes pseudo “1” read test. An 8Kbit macro is developed utilizing a 65nm pure CMOS logic technology. The cell area and the macro size are 15.3m2 and 0.244mm2, respectively.
Keyword (in Japanese) (See Japanese page) 
(in English) antifuse / one-time programmable / gate-oxide breakdown / write disturb / pseudo "1" read test / / /  
Reference Info. IEICE Tech. Rep., vol. 108, no. 6, ICD2008-8, pp. 39-44, April 2008.
Paper # ICD2008-8 
Date of Issue 2008-04-10 (ICD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
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reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ICD2008-8 Link to ES Tech. Rep. Archives: ICD2008-8

Conference Information
Committee ICD  
Conference Date 2008-04-17 - 2008-04-18 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To ICD 
Conference Code 2008-04-ICD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A 65nm Pure CMOS One-time Programmable Memory Using a Two-Port Antifuse Cell Implemented in a Matrix Structure 
Sub Title (in English)  
Keyword(1) antifuse  
Keyword(2) one-time programmable  
Keyword(3) gate-oxide breakdown  
Keyword(4) write disturb  
Keyword(5) pseudo "1" read test  
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1st Author's Name Kensuke Matsufuji  
1st Author's Affiliation Toshiba Corporation (Toshiba)
2nd Author's Name Toshimasa Namekawa  
2nd Author's Affiliation Toshiba Corporation (Toshiba)
3rd Author's Name Hiroaki Nakano  
3rd Author's Affiliation Toshiba Corporation (Toshiba)
4th Author's Name Hiroshi Ito  
4th Author's Affiliation Toshiba Corporation (Toshiba)
5th Author's Name Osamu Wada  
5th Author's Affiliation Toshiba Corporation (Toshiba)
6th Author's Name Nobuaki Otsuka  
6th Author's Affiliation Toshiba Corporation (Toshiba)
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Speaker Author-1 
Date Time 2008-04-18 10:00:00 
Presentation Time 25 minutes 
Registration for ICD 
Paper # ICD2008-8 
Volume (vol) vol.108 
Number (no) no.6 
Page pp.39-44 
#Pages
Date of Issue 2008-04-10 (ICD) 


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