Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information		 Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2008-07-25 14:15
Prototype Development and Performance Characterization of 3-element ESPAR Antenna
Naoki Sakai, Hideyuki Uehara, Takashi Ohira (Toyohashi Univ. of Tech.) AP2008-66
Abstract (in Japanese) (See Japanese page) 
(in English) We clarify the relation between measured and calculated results on FB ratio, diversity gain, and space correlation.
We find the relation between FB ratio and varactor control voltage for element spacing of \FRAC{$\lambda$}{12} from the FBR-maximization experiment.
Measured FBR exhibits 20.7dB at maximum.
We derive the relation between varactor control voltage and reactance from FBR-to-varactor-control-voltage and -to-varactor-reactance characteristics.
This relation derives the relation between special correlation and diversity gain.
These results are useful for design and simulation of applied systems including diversity systems, direction of arrival finder, directional MAC, and secret key agreement systems.
Keyword (in Japanese) (See Japanese page) 
(in English) Espar / Front-to-Back Ratio / Diversity / Spatial Cross Correlation / / / /  
Reference Info. IEICE Tech. Rep., vol. 108, no. 148, AP2008-66, pp. 165-170, July 2008.
Paper # AP2008-66 
Date of Issue 2008-07-16 (AP) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF AP2008-66

Conference Information
Committee AP SAT  
Conference Date 2008-07-23 - 2008-07-25 
Place (in Japanese) (See Japanese page) 
Place (in English) Hokkaido University 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Satellite Communications, Antennas and Progation, etc. 
Paper Information
Registration To AP 
Conference Code 2008-07-AP-SAT 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Prototype Development and Performance Characterization of 3-element ESPAR Antenna 
Sub Title (in English)  
Keyword(1) Espar  
Keyword(2) Front-to-Back Ratio  
Keyword(3) Diversity  
Keyword(4) Spatial Cross Correlation  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Naoki Sakai  
1st Author's Affiliation Toyohashi University of Technology (Toyohashi Univ. of Tech.)
2nd Author's Name Hideyuki Uehara  
2nd Author's Affiliation Toyohashi University of Technology (Toyohashi Univ. of Tech.)
3rd Author's Name Takashi Ohira  
3rd Author's Affiliation Toyohashi University of Technology (Toyohashi Univ. of Tech.)
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2008-07-25 14:15:00 
Presentation Time 25 minutes 
Registration for AP 
Paper # AP2008-66 
Volume (vol) vol.108 
Number (no) no.148 
Page pp.165-170 
#Pages 6 
Date of Issue 2008-07-16 (AP) 

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan