Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information		 Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2008-09-12 10:10
3D Measurement of a Parabola Anntena by Vision Metrololgy -- Easy and high-precision inspection --
Susumu Hattori (Fukuyama Univ.), Yoshiyuki Ohnishi (VML) AP2008-90
Abstract (in Japanese) (See Japanese page) 
(in English) On the inspection of a parabola antenna, measurement precision of more than 1:10,000 is required. Available methods, where many 3D points can be observed in short time, are limited. Practically industrial vision metrology is the best solution for it. This paper presents the principle of measurement, process and attained precision along the measurement of a parabola antenna with 1,600mm diameter. 385 retro targets were placed on the parabola surface and on the legs of a receiver. Estimated precision was 14micro meters on the surface only, and 17micro meters three dimensionally. By adjusting a quadric surface to measurements, the estimated focal length 738.8 pm 0.3mm for design value 740mm, and the adjustment precision of 0.298mm was obtained.
Keyword (in Japanese) (See Japanese page) 
(in English) inspection / parabola antenna / vision metrology / preciison / adjustment / / /  
Reference Info. IEICE Tech. Rep., vol. 108, no. 201, AP2008-90, pp. 91-94, Sept. 2008.
Paper # AP2008-90 
Date of Issue 2008-09-04 (AP) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF AP2008-90

Conference Information
Committee AP  
Conference Date 2008-09-11 - 2008-09-12 
Place (in Japanese) (See Japanese page) 
Place (in English) National Defense Academy 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Etc. 
Paper Information
Registration To AP 
Conference Code 2008-09-AP 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) 3D Measurement of a Parabola Anntena by Vision Metrololgy 
Sub Title (in English) Easy and high-precision inspection 
Keyword(1) inspection  
Keyword(2) parabola antenna  
Keyword(3) vision metrology  
Keyword(4) preciison  
Keyword(5) adjustment  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Susumu Hattori  
1st Author's Affiliation Fukuyama University (Fukuyama Univ.)
2nd Author's Name Yoshiyuki Ohnishi  
2nd Author's Affiliation Vision Metrology Laboratory (VML)
3rd Author's Name  
3rd Author's Affiliation ()
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2008-09-12 10:10:00 
Presentation Time 25 minutes 
Registration for AP 
Paper # AP2008-90 
Volume (vol) vol.108 
Number (no) no.201 
Page pp.91-94 
#Pages 4 
Date of Issue 2008-09-04 (AP) 

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan