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Paper Abstract and Keywords
Presentation 2009-01-23 15:20
Degradation phenomenon of electrical contacts by hammering oscillating mechanism -- for Contact Resistance (III) --
Shin-ichi Wada, Taketo Sonoda, Keiji Koshida, Mitsuo Kikuchi, Hiroaki Kubota (TMC System Co., Ltd.,), Koichiro Sawa (Keio Univ.) EMD2008-116
Abstract (in Japanese) (See Japanese page) 
(in English) The authors have developed the hammering oscillating mechanism which could give real vibration to electrical contacts and studied the influences of a micro-oscillating on contact resistance, and the characteristics of the mechanism has been modeled by PC. By the mechanism the authors made experiments with total operation’s number, about 40 millions. After the term was passed, the contact resistance increased in number to about 200Ω . The tendency continued till the end. Next by using the connectors with smaller contact’s force, the authors made experiments with the same operation’s number. On the contrary, by the sliding contact mechanism the authors made experiments with total operation’s number of 14 millions. After starting, the contact resistance increased to about 200Ω . Although the latter two mechanisms are completely different (in methods, numbers, etc ), the results of two measurements were almost similar on the oscillating phenomenon. It was suggested that the three mechanisms could detect the more real degradation phenomenon on contacts with the influences of micro-vibration by applying the model of fretting corrosion to the fluctuation of contact resistance.
Keyword (in Japanese) (See Japanese page) 
(in English) electrical contact / oscillating mechanism / contact resistance / sliding mechanism / hammering oscillating mechanism / / /  
Reference Info. IEICE Tech. Rep., vol. 108, no. 404, EMD2008-116, pp. 15-20, Jan. 2009.
Paper # EMD2008-116 
Date of Issue 2009-01-16 (EMD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
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reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee EMD  
Conference Date 2009-01-23 - 2009-01-23 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EMD 
Conference Code 2009-01-EMD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Degradation phenomenon of electrical contacts by hammering oscillating mechanism 
Sub Title (in English) for Contact Resistance (III) 
Keyword(1) electrical contact  
Keyword(2) oscillating mechanism  
Keyword(3) contact resistance  
Keyword(4) sliding mechanism  
Keyword(5) hammering oscillating mechanism  
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1st Author's Name Shin-ichi Wada  
1st Author's Affiliation TMC SYSTEM CO., LTD. (TMC System Co., Ltd.,)
2nd Author's Name Taketo Sonoda  
2nd Author's Affiliation TMC SYSTEM CO., LTD. (TMC System Co., Ltd.,)
3rd Author's Name Keiji Koshida  
3rd Author's Affiliation TMC SYSTEM CO., LTD. (TMC System Co., Ltd.,)
4th Author's Name Mitsuo Kikuchi  
4th Author's Affiliation TMC SYSTEM CO., LTD. (TMC System Co., Ltd.,)
5th Author's Name Hiroaki Kubota  
5th Author's Affiliation TMC SYSTEM CO., LTD. (TMC System Co., Ltd.,)
6th Author's Name Koichiro Sawa  
6th Author's Affiliation Keio University K2 Campus, (Keio Univ.)
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Speaker Author-2 
Date Time 2009-01-23 15:20:00 
Presentation Time 25 minutes 
Registration for EMD 
Paper # EMD2008-116 
Volume (vol) vol.108 
Number (no) no.404 
Page pp.15-20 
#Pages 6 
Date of Issue 2009-01-16 (EMD) 

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