Paper Abstract and Keywords |
Presentation |
2009-01-29 13:25
Evaluation of Defects at Grain-boundaries on YBCO/STO Bicrystals Tetsuro Maki, Xiangyan Kong, Yoshihiro Nakatani, Hitoshi Kubo, Masayuki Abe, Hideo Itozaki (Osaka Univ.) SCE2008-33 Link to ES Tech. Rep. Archives: SCE2008-33 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
There is a possibility that surface defects at grain boundary of bicrystal substrates influenced to make defects of YBCO thin films grown on the bicrystal substrates. The defects at grain boundary of STO bicrystal substrates and YBCO thin films grown on the substrates were evaluated by FE-SEM and AFM observation. The defects with the shape reflected by misorientaion angles of the substrates were observed at the STO bicrystal substrates. After film deposition of YBCO, some of the defects of the substrates were flattened, but some made defects of the YBCO thin films grown on them. The observation difference between FE-SEM and AFM was also discussed. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
bicrystal / grain-boundary / defect / high-TC superconductor / Josephson junction / / / |
Reference Info. |
IEICE Tech. Rep., vol. 108, no. 420, SCE2008-33, pp. 7-10, Jan. 2009. |
Paper # |
SCE2008-33 |
Date of Issue |
2009-01-22 (SCE) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
SCE2008-33 Link to ES Tech. Rep. Archives: SCE2008-33 |
Conference Information |
Committee |
SCE |
Conference Date |
2009-01-29 - 2009-01-29 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Kikai-Shinko-Kaikan Bldg |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Analog application, etc |
Paper Information |
Registration To |
SCE |
Conference Code |
2009-01-SCE |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Evaluation of Defects at Grain-boundaries on YBCO/STO Bicrystals |
Sub Title (in English) |
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Keyword(1) |
bicrystal |
Keyword(2) |
grain-boundary |
Keyword(3) |
defect |
Keyword(4) |
high-TC superconductor |
Keyword(5) |
Josephson junction |
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1st Author's Name |
Tetsuro Maki |
1st Author's Affiliation |
Osaka University (Osaka Univ.) |
2nd Author's Name |
Xiangyan Kong |
2nd Author's Affiliation |
Osaka University (Osaka Univ.) |
3rd Author's Name |
Yoshihiro Nakatani |
3rd Author's Affiliation |
Osaka University (Osaka Univ.) |
4th Author's Name |
Hitoshi Kubo |
4th Author's Affiliation |
Osaka University (Osaka Univ.) |
5th Author's Name |
Masayuki Abe |
5th Author's Affiliation |
Osaka University (Osaka Univ.) |
6th Author's Name |
Hideo Itozaki |
6th Author's Affiliation |
Osaka University (Osaka Univ.) |
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Speaker |
Author-1 |
Date Time |
2009-01-29 13:25:00 |
Presentation Time |
25 minutes |
Registration for |
SCE |
Paper # |
SCE2008-33 |
Volume (vol) |
vol.108 |
Number (no) |
no.420 |
Page |
pp.7-10 |
#Pages |
4 |
Date of Issue |
2009-01-22 (SCE) |
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