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Paper Abstract and Keywords
Presentation 2009-01-29 13:25
Evaluation of Defects at Grain-boundaries on YBCO/STO Bicrystals
Tetsuro Maki, Xiangyan Kong, Yoshihiro Nakatani, Hitoshi Kubo, Masayuki Abe, Hideo Itozaki (Osaka Univ.) SCE2008-33 Link to ES Tech. Rep. Archives: SCE2008-33
Abstract (in Japanese) (See Japanese page) 
(in English) There is a possibility that surface defects at grain boundary of bicrystal substrates influenced to make defects of YBCO thin films grown on the bicrystal substrates. The defects at grain boundary of STO bicrystal substrates and YBCO thin films grown on the substrates were evaluated by FE-SEM and AFM observation. The defects with the shape reflected by misorientaion angles of the substrates were observed at the STO bicrystal substrates. After film deposition of YBCO, some of the defects of the substrates were flattened, but some made defects of the YBCO thin films grown on them. The observation difference between FE-SEM and AFM was also discussed.
Keyword (in Japanese) (See Japanese page) 
(in English) bicrystal / grain-boundary / defect / high-TC superconductor / Josephson junction / / /  
Reference Info. IEICE Tech. Rep., vol. 108, no. 420, SCE2008-33, pp. 7-10, Jan. 2009.
Paper # SCE2008-33 
Date of Issue 2009-01-22 (SCE) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
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reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF SCE2008-33 Link to ES Tech. Rep. Archives: SCE2008-33

Conference Information
Committee SCE  
Conference Date 2009-01-29 - 2009-01-29 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Analog application, etc 
Paper Information
Registration To SCE 
Conference Code 2009-01-SCE 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Evaluation of Defects at Grain-boundaries on YBCO/STO Bicrystals 
Sub Title (in English)  
Keyword(1) bicrystal  
Keyword(2) grain-boundary  
Keyword(3) defect  
Keyword(4) high-TC superconductor  
Keyword(5) Josephson junction  
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Keyword(7)  
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1st Author's Name Tetsuro Maki  
1st Author's Affiliation Osaka University (Osaka Univ.)
2nd Author's Name Xiangyan Kong  
2nd Author's Affiliation Osaka University (Osaka Univ.)
3rd Author's Name Yoshihiro Nakatani  
3rd Author's Affiliation Osaka University (Osaka Univ.)
4th Author's Name Hitoshi Kubo  
4th Author's Affiliation Osaka University (Osaka Univ.)
5th Author's Name Masayuki Abe  
5th Author's Affiliation Osaka University (Osaka Univ.)
6th Author's Name Hideo Itozaki  
6th Author's Affiliation Osaka University (Osaka Univ.)
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Speaker Author-1 
Date Time 2009-01-29 13:25:00 
Presentation Time 25 minutes 
Registration for SCE 
Paper # SCE2008-33 
Volume (vol) vol.108 
Number (no) no.420 
Page pp.7-10 
#Pages
Date of Issue 2009-01-22 (SCE) 


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