| IEICE Technical Committee Submission System Conference Paper's Information |
Online Proceedings [Sign in] Tech. Rep. Archives |
| Go Top Page | Go Previous | [Japanese] / [English] |
| Paper Abstract and Keywords | ||
| Presentation | 2009-02-20 14:25 Evaluation of electric contact trouble caused by silicone. -- Evaluation test with new environmental examination device -- Makito Morii, Hiroyuki Moriwaki (OMRON), Hideki Tanaka, Yoshitaka Ueki, Kenji Suzuki, Kimio Yoshizumi, Masanobu Nishikawa (espec)  R2008-52 EMD2008-128 Link to ES Tech. Rep. Archives: EMD2008-128 |
|
| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | The phenomenon of the point of contact's becoming a loose connection with the gas generated from the compound of the organic silicon system is widely known. It is being confirmed the contact trouble phenomenon with silicon is generated when the opening and shutting load area exists in a constant range by a lot of researchers, and is requested the source of the gas of the silicon system not to recommend the device of high airtight type for use by the pertinent load area to evade trouble, and to be put on surroundings. The material of the silicon system expands the range of use recently, and it is a difficult situation to exclude the silicon gas source. Especially, the reliability of the device used is requested to be evaluated in the application for which final user's such as electrical appliances for the car and the consumer electronic system requirements cannot be specified. A relative evaluation method that used the silicon oil etc. was the main in the evaluation of the past as the source of a silicon system gas. The problem exists in the fixed quantity and the reproducibility of the phenomenon though these techniques are comparatively effective in the point of reproduction of a real problem. Then, the author etc. report on the result of evaluating density of a confirmation of the reproducibility of the evaluation, a temperature, and a silicon system gas and gas kinds' influence with an evaluation device that can control the amount of generation and the space temperature of a silicon system gas. |
|
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | silicone / contact / contact trouble / silicon dioxide / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 108, no. 434, EMD2008-128, pp. 49-52, Feb. 2009. | |
| Paper # | EMD2008-128 | |
| Date of Issue | 2009-02-13 (R, EMD) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | R2008-52 EMD2008-128 Link to ES Tech. Rep. Archives: EMD2008-128 |
|
| Conference Information | |
| Committee | EMD R |
| Conference Date | 2009-02-20 - 2009-02-20 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Sumitomo Wiring Systems LTD., Head Office |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | EMD |
| Conference Code | 2009-02-EMD-R |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Evaluation of electric contact trouble caused by silicone. |
| Sub Title (in English) | Evaluation test with new environmental examination device |
| Keyword(1) | silicone |
| Keyword(2) | contact |
| Keyword(3) | contact trouble |
| Keyword(4) | silicon dioxide |
| Keyword(5) | |
| Keyword(6) | |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Makito Morii |
| 1st Author's Affiliation | Omron corporation (OMRON) |
| 2nd Author's Name | Hiroyuki Moriwaki |
| 2nd Author's Affiliation | Omron corporation (OMRON) |
| 3rd Author's Name | Hideki Tanaka |
| 3rd Author's Affiliation | Espec CO. (espec) |
| 4th Author's Name | Yoshitaka Ueki |
| 4th Author's Affiliation | Espec CO. (espec) |
| 5th Author's Name | Kenji Suzuki |
| 5th Author's Affiliation | Espec CO. (espec) |
| 6th Author's Name | Kimio Yoshizumi |
| 6th Author's Affiliation | Espec CO. (espec) |
| 7th Author's Name | Masanobu Nishikawa |
| 7th Author's Affiliation | Espec CO. (espec) |
| 8th Author's Name | |
| 8th Author's Affiliation | () |
| 9th Author's Name | |
| 9th Author's Affiliation | () |
| 10th Author's Name | |
| 10th Author's Affiliation | () |
| 11th Author's Name | |
| 11th Author's Affiliation | () |
| 12th Author's Name | |
| 12th Author's Affiliation | () |
| 13th Author's Name | |
| 13th Author's Affiliation | () |
| 14th Author's Name | |
| 14th Author's Affiliation | () |
| 15th Author's Name | |
| 15th Author's Affiliation | () |
| 16th Author's Name | |
| 16th Author's Affiliation | () |
| 17th Author's Name | |
| 17th Author's Affiliation | () |
| 18th Author's Name | |
| 18th Author's Affiliation | () |
| Speaker | Author-1 |
| Date Time | 2009-02-20 14:25:00 |
| Presentation Time | 25 minutes |
| Registration for | EMD |
| Paper # | R2008-52, EMD2008-128 |
| Volume (vol) | vol.108 |
| Number (no) | no.433(R), no.434(EMD) |
| Page | pp.49-52 |
| #Pages | 4 |
| Date of Issue | 2009-02-13 (R, EMD) |
[Return to Top Page]