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Paper Abstract and Keywords
Presentation 2009-02-27 09:50
Silicon Nanowire pMOSFETs and Single-Hole Transistors at Room Temperature under Uniaxial Strain
YeonJoo Jeong, Chen Jiezhi, Takuya Saraya, Toshiro Hiramoto (Univ. of Tokyo) ED2008-234 SDM2008-226 Link to ES Tech. Rep. Archives: ED2008-234 SDM2008-226
Abstract (in Japanese) (See Japanese page) 
(in English) Uniaxial strain effects on NW pFET and SHT are investigated. In the NW pFET, considerably larger current modulation than NW nFET is observed. To enhance the MOSFET mobility, tensile and compressive direction is beneficial to transverse and longitudinal strain, respectively. The strain effect is decreased as NW width becomes narrower due to small effective mass modulation at narrow NW pFET. In the SHT, Coulomb oscillation characteristics are modulated by the strain and after oscillation vanishes, current modulation converges to constant value due to drift current in SHT.
Keyword (in Japanese) (See Japanese page) 
(in English) Nanowire MOSFET / Single-hole Transistor / Uniaxial strain / Mobility enhancement / Effective mass / Tunneling probability / Quantum energy level /  
Reference Info. IEICE Tech. Rep., vol. 108, no. 438, SDM2008-226, pp. 59-62, Feb. 2009.
Paper # SDM2008-226 
Date of Issue 2009-02-19 (ED, SDM) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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Download PDF ED2008-234 SDM2008-226 Link to ES Tech. Rep. Archives: ED2008-234 SDM2008-226

Conference Information
Committee SDM ED  
Conference Date 2009-02-26 - 2009-02-27 
Place (in Japanese) (See Japanese page) 
Place (in English) Hokkaido Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Functional nanodevices and related technologies 
Paper Information
Registration To SDM 
Conference Code 2009-02-SDM-ED 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Silicon Nanowire pMOSFETs and Single-Hole Transistors at Room Temperature under Uniaxial Strain 
Sub Title (in English)  
Keyword(1) Nanowire MOSFET  
Keyword(2) Single-hole Transistor  
Keyword(3) Uniaxial strain  
Keyword(4) Mobility enhancement  
Keyword(5) Effective mass  
Keyword(6) Tunneling probability  
Keyword(7) Quantum energy level  
Keyword(8)  
1st Author's Name YeonJoo Jeong  
1st Author's Affiliation University of Tokyo (Univ. of Tokyo)
2nd Author's Name Chen Jiezhi  
2nd Author's Affiliation University of Tokyo (Univ. of Tokyo)
3rd Author's Name Takuya Saraya  
3rd Author's Affiliation University of Tokyo (Univ. of Tokyo)
4th Author's Name Toshiro Hiramoto  
4th Author's Affiliation University of Tokyo (Univ. of Tokyo)
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Speaker Author-1 
Date Time 2009-02-27 09:50:00 
Presentation Time 25 minutes 
Registration for SDM 
Paper # ED2008-234, SDM2008-226 
Volume (vol) vol.108 
Number (no) no.437(ED), no.438(SDM) 
Page pp.59-62 
#Pages
Date of Issue 2009-02-19 (ED, SDM) 


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