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Paper Abstract and Keywords
Presentation 2009-04-16 10:15
Simulation Results of QoS Degradation Locating Using in-Network Measurements
Yoichi Hatano, Tsutomu Kitamura, Yasuhiro Yamasaki, Hideyuki Shimonishi (NEC) CQ2009-2
Abstract (in Japanese) (See Japanese page) 
(in English) (Not available yet)
Keyword (in Japanese) (See Japanese page) 
(in English) network monitoring / QoS measurement / active measurement / passive measurement / network tomography / / /  
Reference Info. IEICE Tech. Rep., vol. 109, no. 5, CQ2009-2, pp. 7-12, April 2009.
Paper # CQ2009-2 
Date of Issue 2009-04-09 (CQ) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF CQ2009-2

Conference Information
Committee CQ CS  
Conference Date 2009-04-16 - 2009-04-17 
Place (in Japanese) (See Japanese page) 
Place (in English) Okinawaken Seinen Kaikan 
Topics (in Japanese) (See Japanese page) 
Topics (in English) QoS in Ubiquitous/Broadband Networks, QoS of Media, Models of QoS Estimation, Reliability, Security, Contents, incentives, and General Fields 
Paper Information
Registration To CQ 
Conference Code 2009-04-CQ-CS 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Simulation Results of QoS Degradation Locating Using in-Network Measurements 
Sub Title (in English)  
Keyword(1) network monitoring  
Keyword(2) QoS measurement  
Keyword(3) active measurement  
Keyword(4) passive measurement  
Keyword(5) network tomography  
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1st Author's Name Yoichi Hatano  
1st Author's Affiliation NEC Corporation (NEC)
2nd Author's Name Tsutomu Kitamura  
2nd Author's Affiliation NEC Corporation (NEC)
3rd Author's Name Yasuhiro Yamasaki  
3rd Author's Affiliation NEC Corporation (NEC)
4th Author's Name Hideyuki Shimonishi  
4th Author's Affiliation NEC Corporation (NEC)
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Speaker Author-1 
Date Time 2009-04-16 10:15:00 
Presentation Time 25 minutes 
Registration for CQ 
Paper # CQ2009-2 
Volume (vol) vol.109 
Number (no) no.5 
Page pp.7-12 
#Pages
Date of Issue 2009-04-09 (CQ) 


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