Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information		 Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2009-04-23 11:10
Fundamental Study on Measurement of Complex Permittivity for Liquid Material Using the Open Ended Cutoff Circular Waveguide Reflection Method
Kouji Shibata, Hirotaku Gin, Yoichiro Masuda (Hachinohe I.T.) SCE2009-4 MW2009-4
Abstract (in Japanese) (See Japanese page) 
(in English) Various studies of specific absorption rates (SARs) using liquid phantoms imitating human body tissues have been widely carried out in electromagnetic compatibility (EMC) research fields. In order to establish the accurate SAR for the measurement, a faithful mock of the human body tissue is needed. Therefore, knowledge of the accurate measurement of sample materials with high-permittivity and high-loss is very important. In this study, the complex permittivity of a liquid phantom material is measured by the coaxial feed open ended cut-off circular waveguide reflection method. The effectiveness of the presented method of measuring a liquid phantom with high-permittivity and high-loss is also confirmed by comparing the measured results with the results obtained by the TM010 circular cavity resonator method.
Keyword (in Japanese) (See Japanese page) 
(in English) Complex Permittivity / Liquid Phantom / Coaxial line / Waveguide / Cylindrical Cavity Resonator / Mode-Matching Technique / Mode-Matching Method / Modal Analysis  
Reference Info. IEICE Tech. Rep., vol. 109, no. 15, MW2009-4, pp. 17-22, April 2009.
Paper # MW2009-4 
Date of Issue 2009-04-16 (SCE, MW) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF SCE2009-4 MW2009-4

Conference Information
Committee MW SCE  
Conference Date 2009-04-23 - 2009-04-23 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To MW 
Conference Code 2009-04-MW-SCE 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Fundamental Study on Measurement of Complex Permittivity for Liquid Material Using the Open Ended Cutoff Circular Waveguide Reflection Method 
Sub Title (in English)  
Keyword(1) Complex Permittivity  
Keyword(2) Liquid Phantom  
Keyword(3) Coaxial line  
Keyword(4) Waveguide  
Keyword(5) Cylindrical Cavity Resonator  
Keyword(6) Mode-Matching Technique  
Keyword(7) Mode-Matching Method  
Keyword(8) Modal Analysis  
1st Author's Name Kouji Shibata  
1st Author's Affiliation Hachinohe Institute of Technology (Hachinohe I.T.)
2nd Author's Name Hirotaku Gin  
2nd Author's Affiliation Hachinohe Institute of Technology (Hachinohe I.T.)
3rd Author's Name Yoichiro Masuda  
3rd Author's Affiliation Professor Emeritus at Hachinohe Institute of Technology (Hachinohe I.T.)
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2009-04-23 11:10:00 
Presentation Time 25 minutes 
Registration for MW 
Paper # SCE2009-4, MW2009-4 
Volume (vol) vol.109 
Number (no) no.14(SCE), no.15(MW) 
Page pp.17-22 
#Pages 6 
Date of Issue 2009-04-16 (SCE, MW) 

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan