Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information		 Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2009-06-05 14:25
De-embedding of Board Parasitics with T-Parameters for S-Parameter Measurements of Integrated Circuits on PCB -- Examinations in One-port Measurements --
Kazuki Maeda, Kengo Iokibe, Yoshitaka Toyota, Ryuji Koga (Okayama Univ.) EMCJ2009-30
Abstract (in Japanese) (See Japanese page) 
(in English) In measuring S-parameters of integrated circuits (ICs) mounted on a printed circuit board, it is necessary to de-embed parasitics on board traces and connectors.
The parasitics can be de-embeded by two kinds of methods in the S-parameter measurements: methods that set measurement ports adjacent to ports of IC terminals and methods that extract intrinsic parameters of ICs from measured parameters involving effects of the parasitics.
Firstly, we represented several results of the former methods and their possible errors.
Secondly, we applied the latter methods to a known RC series circuit as employing T-parameters for the de-embedding of parasitics.
The RC series circuit, supposing a typical power-ground impedance of ICs, was extracted successfully up to 2 GHz, after T-parameters of board traces had been experimentally obtained.
The T-parameters were also obtained through an electromagnetic calculations as refering the structure of the board traces and they produce another set of IC parameters that agreed with the experimental set up to 2 GHz.
Keyword (in Japanese) (See Japanese page) 
(in English) T-parameter / de-embedding / IC / EMC model / / / /  
Reference Info. IEICE Tech. Rep., vol. 109, no. 76, EMCJ2009-30, pp. 45-50, June 2009.
Paper # EMCJ2009-30 
Date of Issue 2009-05-29 (EMCJ) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMCJ2009-30

Conference Information
Committee EMCJ  
Conference Date 2009-06-05 - 2009-06-05 
Place (in Japanese) (See Japanese page) 
Place (in English) Tokyo Big Sight (Tokyo International Exihibition Center) 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Young Scientists Award for Excellent Presentations 
Paper Information
Registration To EMCJ 
Conference Code 2009-06-EMCJ 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) De-embedding of Board Parasitics with T-Parameters for S-Parameter Measurements of Integrated Circuits on PCB 
Sub Title (in English) Examinations in One-port Measurements 
Keyword(1) T-parameter  
Keyword(2) de-embedding  
Keyword(3) IC  
Keyword(4) EMC model  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Kazuki Maeda  
1st Author's Affiliation Okayama University (Okayama Univ.)
2nd Author's Name Kengo Iokibe  
2nd Author's Affiliation Okayama University (Okayama Univ.)
3rd Author's Name Yoshitaka Toyota  
3rd Author's Affiliation Okayama University (Okayama Univ.)
4th Author's Name Ryuji Koga  
4th Author's Affiliation Okayama University (Okayama Univ.)
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2009-06-05 14:25:00 
Presentation Time 25 minutes 
Registration for EMCJ 
Paper # EMCJ2009-30 
Volume (vol) vol.109 
Number (no) no.76 
Page pp.45-50 
#Pages 6 
Date of Issue 2009-05-29 (EMCJ) 

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan