Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information		 Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2009-06-19 16:45
An experimental study on influences of contct opening speeds on break arc characteristics of Ag contacts
Asuka Sudo, Makoto Hasegawa (Chitose Inst. of Sci. & Tech.) EMD2009-20 CPM2009-32 OME2009-27
Abstract (in Japanese) (See Japanese page) 
(in English) In order to study the influences of contact opening speeds on break arc behaviors, Ag contacts were operated to break inductive DC load currents from 0.1 A to 2.0 A at 14 V with contact opening speeds of 1 mm/s, 5 mm/s and 10 mm/s in a switching mechanism employing a stepping motor. Occurrence rates of break arcs and their average durations were determined at each current level under the respective contact opening speeds. From the results, irrespective of the opening speed values, at the conventional minimum arc current level of 0.4A, the arc occurrence rates were almost 100% and the average arc durations were around 10 to 30 μs. This confirmed the author’s previous observations in which the conventional minimum arc current level should be considered as the threshold level for arc discharges of certain duration to occur at the rate of almost 100%. The arc occurrence rates below 0.4A were slightly influenced by changes in the contact opening speeds. With respect to arc extinction gaps calculated by multiplying the average arc duration value and the contact opening speed value, it was found that with increasing the contact opening speeds, arc extinction gaps became larger, although they were on the order of several tens μm or less in the tested conditions.
Keyword (in Japanese) (See Japanese page) 
(in English) Arc discharge / Arc extinction gap length / Contact opening speed / Minimum arc current / Ag contacts / / /  
Reference Info. IEICE Tech. Rep., vol. 109, no. 89, EMD2009-20, pp. 33-38, June 2009.
Paper # EMD2009-20 
Date of Issue 2009-06-12 (EMD, CPM, OME) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMD2009-20 CPM2009-32 OME2009-27

Conference Information
Committee CPM EMD OME  
Conference Date 2009-06-19 - 2009-06-19 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EMD 
Conference Code 2009-06-CPM-EMD-OME 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) An experimental study on influences of contct opening speeds on break arc characteristics of Ag contacts 
Sub Title (in English)  
Keyword(1) Arc discharge  
Keyword(2) Arc extinction gap length  
Keyword(3) Contact opening speed  
Keyword(4) Minimum arc current  
Keyword(5) Ag contacts  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Asuka Sudo  
1st Author's Affiliation Chitose Institute of Science and Technology (Chitose Inst. of Sci. & Tech.)
2nd Author's Name Makoto Hasegawa  
2nd Author's Affiliation Chitose Institute of Science and Technology (Chitose Inst. of Sci. & Tech.)
3rd Author's Name  
3rd Author's Affiliation ()
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2009-06-19 16:45:00 
Presentation Time 25 minutes 
Registration for EMD 
Paper # EMD2009-20, CPM2009-32, OME2009-27 
Volume (vol) vol.109 
Number (no) no.89(EMD), no.90(CPM), no.91(OME) 
Page pp.33-38 
#Pages 6 
Date of Issue 2009-06-12 (EMD, CPM, OME) 

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan