Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information		 Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2009-07-17 13:30
Degradation phenomenon of electrical contacts by hammering oscillating mechanism -- modeling of the oscillating mechanism (4) --
Shin-ichi Wada, Keiji Koshida, Taketo Sonoda, Saindaa Norovling, Mitsuo Kikuchi, Hiroaki Kubota (TMC System Co.Ltd.), Koichiro Sawa (Keio Univ.) EMD2009-21
Abstract (in Japanese) (See Japanese page) 
(in English) The authors have developed the mechanism which gives vibration to electrical contacts by hammering oscillation and studied the influences of a micro-oscillating on the contacts. In time field, by means of unit step function as a external force, they carried out mathematical approach and the simulation of dynamical characteristics of the mechanism with a personal computer (PC). In addition, in space field, it was suggested that the analytical modeling of thin film was carried out using continuous approximation. By making use of this model, it was possible for estimation approximately of fundamental mechanical quantities, such as displacement, acceleration, and mechanical energy.
Keyword (in Japanese) (See Japanese page) 
(in English) electrical contact / hammering oscillating mechanism / mathematical model / continuous model / time field / space field / simulation /  
Reference Info. IEICE Tech. Rep., vol. 109, no. 138, EMD2009-21, pp. 1-6, July 2009.
Paper # EMD2009-21 
Date of Issue 2009-07-10 (EMD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMD2009-21

Conference Information
Committee EMD  
Conference Date 2009-07-17 - 2009-07-17 
Place (in Japanese) (See Japanese page) 
Place (in English) Chitose Arcadia Plaza 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EMD 
Conference Code 2009-07-EMD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Degradation phenomenon of electrical contacts by hammering oscillating mechanism 
Sub Title (in English) modeling of the oscillating mechanism (4) 
Keyword(1) electrical contact  
Keyword(2) hammering oscillating mechanism  
Keyword(3) mathematical model  
Keyword(4) continuous model  
Keyword(5) time field  
Keyword(6) space field  
Keyword(7) simulation  
Keyword(8)  
1st Author's Name Shin-ichi Wada  
1st Author's Affiliation TMC System Co.Ltd. (TMC System Co.Ltd.)
2nd Author's Name Keiji Koshida  
2nd Author's Affiliation TMC System Co.Ltd. (TMC System Co.Ltd.)
3rd Author's Name Taketo Sonoda  
3rd Author's Affiliation TMC System Co.Ltd. (TMC System Co.Ltd.)
4th Author's Name Saindaa Norovling  
4th Author's Affiliation TMC System Co.Ltd. (TMC System Co.Ltd.)
5th Author's Name Mitsuo Kikuchi  
5th Author's Affiliation TMC System Co.Ltd. (TMC System Co.Ltd.)
6th Author's Name Hiroaki Kubota  
6th Author's Affiliation TMC System Co.Ltd. (TMC System Co.Ltd.)
7th Author's Name Koichiro Sawa  
7th Author's Affiliation Keio University. (Keio Univ.)
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2009-07-17 13:30:00 
Presentation Time 25 minutes 
Registration for EMD 
Paper # EMD2009-21 
Volume (vol) vol.109 
Number (no) no.138 
Page pp.1-6 
#Pages 6 
Date of Issue 2009-07-10 (EMD) 

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan