IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2009-07-31 16:20
Top Event Probability of a Repairable Dynamic FT
Tetsushi Yuge, Nobuyuki Tamura, Shigeru Yanagi (NDA) R2009-31
Abstract (in Japanese) (See Japanese page) 
(in English) A priority AND gate is a representative logic gate of dynamic fault trees. This paper deals with a repairable dynamic FT, where all the basic events are repaired after the occurrence. Markov analysis is usually adopted for the analysis of a repairable dynamic FT. The difficulty of the method is mainly due to the explosion of the number of states to be considered in the analysis. Another problem is the difficulty to construct the state transition matrix when an OR gate is connected to the input of a priority AND gate. We explain the problems at first. Then we introduce two methods to obtain the steady state top event probability. The proposed methods are an Inclusion-Exclusion based method and a method to enumerate the disjoint cut sequences. These methods are more efficient compared to the conventional Markov approach. However, there are some FTs that the exact top event probability can not be derived by these methods. We discuss the applicability of the methods.
Keyword (in Japanese) (See Japanese page) 
(in English) dynamic fault tree / priority AND gate / minimal cut sequence / Markov analysis / / / /  
Reference Info. IEICE Tech. Rep., vol. 109, no. 161, R2009-31, pp. 53-58, July 2009.
Paper # R2009-31 
Date of Issue 2009-07-24 (R) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF R2009-31

Conference Information
Committee R  
Conference Date 2009-07-31 - 2009-07-31 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To R 
Conference Code 2009-07-R 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Top Event Probability of a Repairable Dynamic FT 
Sub Title (in English)  
Keyword(1) dynamic fault tree  
Keyword(2) priority AND gate  
Keyword(3) minimal cut sequence  
Keyword(4) Markov analysis  
1st Author's Name Tetsushi Yuge  
1st Author's Affiliation National Defense Academy (NDA)
2nd Author's Name Nobuyuki Tamura  
2nd Author's Affiliation National Defense Academy (NDA)
3rd Author's Name Shigeru Yanagi  
3rd Author's Affiliation National Defense Academy (NDA)
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2009-07-31 16:20:00 
Presentation Time 20 minutes 
Registration for R 
Paper # R2009-31 
Volume (vol) vol.109 
Number (no) no.161 
Page pp.53-58 
Date of Issue 2009-07-24 (R) 

[Return to Top Page]

[Return to IEICE Web Page]

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan