Paper Abstract and Keywords |
Presentation |
2009-08-21 17:05
Degradation phenomenon of electrical contacts by hammering oscillating mechanism
-- Contact Resistance(VII) -- Shin-ichi Wada, Taketo Sonoda, Keiji Koshida, Saindaa Norovling, Mitsuo Kikuchi, Hiroaki Kubota (TMC), Koichiro Sawa (Keio Univ.) EMD2009-58 CPM2009-82 OPE2009-106 LQE2009-65 Link to ES Tech. Rep. Archives: EMD2009-58 CPM2009-82 OPE2009-106 LQE2009-65 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
Authors studied the influence on contact resistance by micro-vibration to electrical contacts using hammering oscillation mechanism in the vertical direction. It was observed that the degradation phenomenon of electrical contacts of connecters by way of oscillating circuit boards with connecters for wire bonding with each other at the acceleration of 150G using hammering oscillating mechanism (HOM). In this study, SD memory cards were oscillated by HOM. Because the SD memory cards are used in the mobile machinery for auxiliary storage unit, it was considered that there was the necessity of analysis of the characteristics of the memory for oscillation. As a result of the experiment, it was shown that there was degradation phenomenon of electrical contacts after 20 millions hammerings. It was suggested that the fretting corrosion model or sliding contact one would be applied to the fluctuation of contact resistance. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
electrical contact / micro-oscillation / contact resistance / hammering oscillating mechanism / contact force / inertial force / SD memory card / |
Reference Info. |
IEICE Tech. Rep., vol. 109, no. 173, EMD2009-58, pp. 169-174, Aug. 2009. |
Paper # |
EMD2009-58 |
Date of Issue |
2009-08-13 (EMD, CPM, OPE, LQE) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
EMD2009-58 CPM2009-82 OPE2009-106 LQE2009-65 Link to ES Tech. Rep. Archives: EMD2009-58 CPM2009-82 OPE2009-106 LQE2009-65 |
Conference Information |
Committee |
OPE EMD CPM LQE |
Conference Date |
2009-08-20 - 2009-08-21 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
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Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
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Paper Information |
Registration To |
EMD |
Conference Code |
2009-08-OPE-EMD-CPM-LQE |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Degradation phenomenon of electrical contacts by hammering oscillating mechanism |
Sub Title (in English) |
Contact Resistance(VII) |
Keyword(1) |
electrical contact |
Keyword(2) |
micro-oscillation |
Keyword(3) |
contact resistance |
Keyword(4) |
hammering oscillating mechanism |
Keyword(5) |
contact force |
Keyword(6) |
inertial force |
Keyword(7) |
SD memory card |
Keyword(8) |
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1st Author's Name |
Shin-ichi Wada |
1st Author's Affiliation |
TMC System Co.Ltd. (TMC) |
2nd Author's Name |
Taketo Sonoda |
2nd Author's Affiliation |
TMC System Co.Ltd. (TMC) |
3rd Author's Name |
Keiji Koshida |
3rd Author's Affiliation |
TMC System Co.Ltd. (TMC) |
4th Author's Name |
Saindaa Norovling |
4th Author's Affiliation |
TMC System Co.Ltd. (TMC) |
5th Author's Name |
Mitsuo Kikuchi |
5th Author's Affiliation |
TMC System Co.Ltd. (TMC) |
6th Author's Name |
Hiroaki Kubota |
6th Author's Affiliation |
TMC System Co.Ltd. (TMC) |
7th Author's Name |
Koichiro Sawa |
7th Author's Affiliation |
Keio University. (Keio Univ.) |
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Speaker |
Author-1 |
Date Time |
2009-08-21 17:05:00 |
Presentation Time |
25 minutes |
Registration for |
EMD |
Paper # |
EMD2009-58, CPM2009-82, OPE2009-106, LQE2009-65 |
Volume (vol) |
vol.109 |
Number (no) |
no.173(EMD), no.174(CPM), no.175(OPE), no.176(LQE) |
Page |
pp.169-174 |
#Pages |
6 |
Date of Issue |
2009-08-13 (EMD, CPM, OPE, LQE) |
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