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Paper Abstract and Keywords
Presentation 2009-09-04 15:45
Time-domain evaluation of Rediated Emission Measurement results using Optical Devices and Network Analyzer
Satoru Kurokawa, Michitaka Ameya, Masanobu Hirose (AIST)
Abstract (in Japanese) (See Japanese page) 
(in English) We propose a optical fiber link electromagnetic interference measurement system that consists of a transmitting optical fiber link system, a receiving optical fiber link system, and a vector network analyzer. Our proposed optical system can measure S21() and S21(t) with the radiated electromagnetic interference measurement. We show experimental results of S21s between a small biconical antenna with a comb generator box and a log-periodic antenna or a biconical antenna measured by our proposed optical link system. It is proved that our proposed optical system can be used to evaluate the radiated electromagnetic interference measurement.
Keyword (in Japanese) (See Japanese page) 
(in English) EMI measurement / Time-domain / Optical device / Vector network analyzer / Microwave photonics / / /  
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Conference Information
Committee ACT  
Conference Date 2009-09-04 - 2009-09-04 
Place (in Japanese) (See Japanese page) 
Place (in English) Keihanna Plaza 
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Paper Information
Registration To ACT 
Conference Code 2009-09-ACT 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Time-domain evaluation of Rediated Emission Measurement results using Optical Devices and Network Analyzer 
Sub Title (in English)  
Keyword(1) EMI measurement  
Keyword(2) Time-domain  
Keyword(3) Optical device  
Keyword(4) Vector network analyzer  
Keyword(5) Microwave photonics  
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1st Author's Name Satoru Kurokawa  
1st Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
2nd Author's Name Michitaka Ameya  
2nd Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
3rd Author's Name Masanobu Hirose  
3rd Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
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Speaker Author-1 
Date Time 2009-09-04 15:45:00 
Presentation Time 25 minutes 
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