| Paper Abstract and Keywords |
| Presentation |
2009-10-30 16:15
Effect of real contact point on constriction resistance of apparent contact area Shigeru Sawada, Terutaka Tamai (Mie Univ,), Yasuhiro Hattori (AutoNetworks Technologyies, Ltd.), Kazuo Iida (Mie Univ,) EMD2009-65 |
| Abstract |
(in Japanese) |
(See Japanese page) |
| (in English) |
Many researchers have studied influences of contact shape, plating conditions, and surface roughness on constriction resistance in contact-point contingence. However, any detail researches have not been made to know how constriction resistance in the apparent contact area of connector contact depends on the distribution status of real contact points and depends on the real contact area. In our study, therefore, constriction resistance is calculated by considering current-carrying-spot area and dispersion-status dependence using numerical analysis. This study proves that contact resistance does not increase beyond 1.5 times even if the real contact area is about 15% of the apparent contact area. This study also proves that when real contact area is at least about 60% of the apparent contact area, the contact resistance is approximately the same as the constriction resistance acquired from the apparent contact area. When the real contact area is about 50% of the apparent contact area, the contact resistance is approximately constant without regard to the contact shape and contact-point dispersion layout. Therefore, it is proved that contact resistance can be practically calculated using apparent contact area instead of real contact area when there are many electrical contact points caused by metal adhesion. |
| Keyword |
(in Japanese) |
(See Japanese page) |
| (in English) |
Electrical contact / constriction resistance / real contact area / numerical analysis / apparent contact area / / / |
| Reference Info. |
IEICE Tech. Rep., vol. 109, no. 263, EMD2009-65, pp. 39-44, Oct. 2009. |
| Paper # |
EMD2009-65 |
| Date of Issue |
2009-10-23 (EMD) |
| ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
| Download PDF |
EMD2009-65 |
| Conference Information |
| Committee |
EMD |
| Conference Date |
2009-10-30 - 2009-10-30 |
| Place (in Japanese) |
(See Japanese page) |
| Place (in English) |
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| Topics (in Japanese) |
(See Japanese page) |
| Topics (in English) |
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| Paper Information |
| Registration To |
EMD |
| Conference Code |
2009-10-EMD |
| Language |
Japanese |
| Title (in Japanese) |
(See Japanese page) |
| Sub Title (in Japanese) |
(See Japanese page) |
| Title (in English) |
Effect of real contact point on constriction resistance of apparent contact area |
| Sub Title (in English) |
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| Keyword(1) |
Electrical contact |
| Keyword(2) |
constriction resistance |
| Keyword(3) |
real contact area |
| Keyword(4) |
numerical analysis |
| Keyword(5) |
apparent contact area |
| Keyword(6) |
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| Keyword(7) |
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| Keyword(8) |
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| 1st Author's Name |
Shigeru Sawada |
| 1st Author's Affiliation |
Mie University (Mie Univ,) |
| 2nd Author's Name |
Terutaka Tamai |
| 2nd Author's Affiliation |
Mie University (Mie Univ,) |
| 3rd Author's Name |
Yasuhiro Hattori |
| 3rd Author's Affiliation |
AutoNetworks Technologyies, Ltd. (AutoNetworks Technologyies, Ltd.) |
| 4th Author's Name |
Kazuo Iida |
| 4th Author's Affiliation |
Mie University (Mie Univ,) |
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| Speaker |
Author-1 |
| Date Time |
2009-10-30 16:15:00 |
| Presentation Time |
25 minutes |
| Registration for |
EMD |
| Paper # |
EMD2009-65 |
| Volume (vol) |
vol.109 |
| Number (no) |
no.263 |
| Page |
pp.39-44 |
| #Pages |
6 |
| Date of Issue |
2009-10-23 (EMD) |