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Paper Abstract and Keywords
Presentation 2009-11-13 10:00
Impact of Self-Heating Effect on the Electrical Characteristics of Nanoscale Transistors
Yoshinari Kamakura, Nobuya Mori (Osaka Univ./JST), Kenji Taniguchi (Osaka Univ.) SDM2009-142
Abstract (in Japanese) (See Japanese page) 
(in English) Hot phonon generation and its impact on the current conduction in nanoscale Si-MOSFETs are investigated using numerical simulations. In the quasi-ballistic transport regime, injected electrons from the source lose their energies by emitting optical phonons in the drain. Since the group velocity of the optical phonons are very slow, the heat conduction can occur after the phonon-phonon scattering changes the optical phonons to the acoustic phonons, and if this process is too slow, then the hot phonons are generated. We demonstrate that the hot phonon temperature is larger than that of acoustic phonons by > 100 K, which would become a reliability concern, while its impact on the current conduction is not significant.
Keyword (in Japanese) (See Japanese page) 
(in English) MOSFET / self-heating / nano / hot phonon / Monte Carlo simulation / heat conduction equation / /  
Reference Info. IEICE Tech. Rep., vol. 109, no. 278, SDM2009-142, pp. 39-44, Nov. 2009.
Paper # SDM2009-142 
Date of Issue 2009-11-05 (SDM) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF SDM2009-142

Conference Information
Committee SDM  
Conference Date 2009-11-12 - 2009-11-13 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Process, Device, Circuit Simulation, etc. 
Paper Information
Registration To SDM 
Conference Code 2009-11-SDM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Impact of Self-Heating Effect on the Electrical Characteristics of Nanoscale Transistors 
Sub Title (in English)  
Keyword(1) MOSFET  
Keyword(2) self-heating  
Keyword(3) nano  
Keyword(4) hot phonon  
Keyword(5) Monte Carlo simulation  
Keyword(6) heat conduction equation  
Keyword(7)  
Keyword(8)  
1st Author's Name Yoshinari Kamakura  
1st Author's Affiliation Osaka University/JST (Osaka Univ./JST)
2nd Author's Name Nobuya Mori  
2nd Author's Affiliation Osaka University/JST (Osaka Univ./JST)
3rd Author's Name Kenji Taniguchi  
3rd Author's Affiliation Osaka University (Osaka Univ.)
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Speaker Author-1 
Date Time 2009-11-13 10:00:00 
Presentation Time 25 minutes 
Registration for SDM 
Paper # SDM2009-142 
Volume (vol) vol.109 
Number (no) no.278 
Page pp.39-44 
#Pages 6 
Date of Issue 2009-11-05 (SDM) 

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