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Paper Abstract and Keywords
Presentation 2009-11-13 15:15
[Invited Talk] Reduction of Read Gap Length by Thin Exchange Bias Layer
Chiharu Mitsumata (Hitachi Metals), Akimasa Sakuma, Kazuaki Fukamichi (Tohoku Univ.) MR2009-33
Abstract (in Japanese) (See Japanese page) 
(in English) For the material design of thin exchange bias layer to reduce the read gap length, the exchange bias between the ferromagnetic(FM) and antiferromagnetic(AFM) bilayer was investigated within the framework of the classical Heisenberg model. The dependence of the exchange bias on the AFM layer thickness was also calculated by using the Landau-Lifshitz-Gilbert equation. The triple-Q(3Q), T1 and AF-I spin structures are obtained in the disordered γ-phase, ordered L12- and L10-type lattices, respectively. The exchange bias is caused by the formation of the interfacial domain wall in the AFM layer, and the critical thickness dc of AFM layer is dominated by the varied spin structures. Consequently, the relation of the critical thickness can be represented as √3d3Qc =
√2dT1c = dAF−Ic .
Keyword (in Japanese) (See Japanese page) 
(in English) exchange bias / antiferromagnetic / critical thickness / magnetic domain wall / spin structure / / /  
Reference Info. IEICE Tech. Rep., vol. 109, Nov. 2009.
Paper #  
Date of Issue 2009-11-06 (MR) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF MR2009-33

Conference Information
Committee ITE-MMS MRIS  
Conference Date 2009-11-13 - 2009-11-13 
Place (in Japanese) (See Japanese page) 
Place (in English) Waseda Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) HDD, etc. 
Paper Information
Registration To MRIS 
Conference Code 2009-11-MMS-MR 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Reduction of Read Gap Length by Thin Exchange Bias Layer 
Sub Title (in English)  
Keyword(1) exchange bias  
Keyword(2) antiferromagnetic  
Keyword(3) critical thickness  
Keyword(4) magnetic domain wall  
Keyword(5) spin structure  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Chiharu Mitsumata  
1st Author's Affiliation Hitachi Metals, Ltd. (Hitachi Metals)
2nd Author's Name Akimasa Sakuma  
2nd Author's Affiliation Tohoku Univ. (Tohoku Univ.)
3rd Author's Name Kazuaki Fukamichi  
3rd Author's Affiliation Tohoku Univ. (Tohoku Univ.)
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Speaker Author-1 
Date Time 2009-11-13 15:15:00 
Presentation Time 45 minutes 
Registration for MRIS 
Paper # MR2009-33 
Volume (vol) vol.109 
Number (no) no.282 
Page pp.25-30 
#Pages 6 
Date of Issue 2009-11-06 (MR) 

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