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| Presentation | 2010-01-29 10:50 High-precision Measurement of the Threshold Voltage, the Elastic Constants Ratio and the Dielectric Constants Ratio of Liquid Crystal Materials Yusuke Chiba, Yuji Ohno, Takahiro Ishinabe, Tetsuya Miyashita, Tatsuo Uchida (Tohoku Univ.)  EID2009-71 Link to ES Tech. Rep. Archives: EID2009-71 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | We devised a high-precision method of measuring the threshold voltage and the elastic and dielectric constants ratios of liquid crystal materials. We obtained these parameters from measuring the alignment distribution of homogeneous alignment LC cell in the on state. We confirmed the validly of this method through measurements of several LC cells with different gaps. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Liquid crystal / High-precision measurement / Threshold voltage / Elastic constants ratio / Dielectric constants ratio / Capacitance of alignment layer / / | |
| Reference Info. | IEICE Tech. Rep., vol. 109, pp. 99-102, Jan. 2010. | |
| Paper # | ||
| Date of Issue | 2010-01-21 (EID) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | EID2009-71 Link to ES Tech. Rep. Archives: EID2009-71 |
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| Conference Information | |
| Committee | ITE-IDY EID IEIJ-SSL IEE-EDD |
| Conference Date | 2010-01-28 - 2010-01-29 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kyusyu Univ. (Chikushi Campus) |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | ITE-IDY |
| Conference Code | 2010-01-IDY-EID-OMD-EDD |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | High-precision Measurement of the Threshold Voltage, the Elastic Constants Ratio and the Dielectric Constants Ratio of Liquid Crystal Materials |
| Sub Title (in English) | |
| Keyword(1) | Liquid crystal |
| Keyword(2) | High-precision measurement |
| Keyword(3) | Threshold voltage |
| Keyword(4) | Elastic constants ratio |
| Keyword(5) | Dielectric constants ratio |
| Keyword(6) | Capacitance of alignment layer |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Yusuke Chiba |
| 1st Author's Affiliation | Tohoku University (Tohoku Univ.) |
| 2nd Author's Name | Yuji Ohno |
| 2nd Author's Affiliation | Tohoku University (Tohoku Univ.) |
| 3rd Author's Name | Takahiro Ishinabe |
| 3rd Author's Affiliation | Tohoku University (Tohoku Univ.) |
| 4th Author's Name | Tetsuya Miyashita |
| 4th Author's Affiliation | Tohoku University (Tohoku Univ.) |
| 5th Author's Name | Tatsuo Uchida |
| 5th Author's Affiliation | Tohoku University (Tohoku Univ.) |
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| Speaker | Author-1 |
| Date Time | 2010-01-29 10:50:00 |
| Presentation Time | 10 minutes |
| Registration for | ITE-IDY |
| Paper # | EID2009-71 |
| Volume (vol) | vol.109 |
| Number (no) | no.404 |
| Page | pp.99-102 |
| #Pages | 4 |
| Date of Issue | 2010-01-21 (EID) |
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