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| Presentation | 2010-01-29 10:05 Quality Evaluation Method for Metallic Topcoats with Imaging Devices Shunsuke Soga, Yoshifumi Shimodaira (Shizuoka Univ.)  EID2009-64 Link to ES Tech. Rep. Archives: EID2009-64 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | We have made a still camera which could acquire XYZ tristimulus values，and constructed high fidelity color reproduction system．In this paper，we examined the efficient method of evaluating quality of metallic topcoats by using this system．We made images by changing chroma，hue，luminance and luminance of flake pigments，and obtained the tolerance by the subjectivity evaluation experiment．As a result，we obtained the relation of linear between threshold about luminance of flake pigments and value or area of it，threshold about the others and standard deviation of luminance．We propose the method by using this relation． | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Metallic / Quality / Subjectivity Evaluation / Threshold / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 109, pp. 69-72, Jan. 2010. | |
| Paper # | ||
| Date of Issue | 2010-01-21 (EID) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | EID2009-64 Link to ES Tech. Rep. Archives: EID2009-64 |
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| Conference Information | |
| Committee | ITE-IDY EID IEIJ-SSL IEE-EDD |
| Conference Date | 2010-01-28 - 2010-01-29 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kyusyu Univ. (Chikushi Campus) |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | ITE-IDY |
| Conference Code | 2010-01-IDY-EID-OMD-EDD |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Quality Evaluation Method for Metallic Topcoats with Imaging Devices |
| Sub Title (in English) | |
| Keyword(1) | Metallic |
| Keyword(2) | Quality |
| Keyword(3) | Subjectivity Evaluation |
| Keyword(4) | Threshold |
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| 1st Author's Name | Shunsuke Soga |
| 1st Author's Affiliation | Shizuoka University (Shizuoka Univ.) |
| 2nd Author's Name | Yoshifumi Shimodaira |
| 2nd Author's Affiliation | Shizuoka University (Shizuoka Univ.) |
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| Speaker | Author-1 |
| Date Time | 2010-01-29 10:05:00 |
| Presentation Time | 5 minutes |
| Registration for | ITE-IDY |
| Paper # | EID2009-64 |
| Volume (vol) | vol.109 |
| Number (no) | no.404 |
| Page | pp.69-72 |
| #Pages | 4 |
| Date of Issue | 2010-01-21 (EID) |
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