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Paper Abstract and Keywords
Presentation 2010-02-19 12:35
Degradation phenomenon of electrical contacts by hammering oscillating mechanism -- Modeling of the oscillating mechanism (7) --
Shin-ichi Wada, Keiji Koshida, Taketo Sonoda, Saindaa Norovling, Mitsuo Kikuchi, Hiroaki Kubota (TMC System Co.Ltd.), Koichiro Sawa (former Keio Univ/Nippon Inst. of Tech.) R2009-50 EMD2009-117
Abstract (in Japanese) (See Japanese page) 
(in English) The authors have developed the mechanism which gives vibration to electrical contacts by hammering oscillation and studied the influences of a micro-oscillating on the contacts. In time field, by means of combinations of unit step functions as external force, using approximation of material particle, they carried out mathematical approach and the simulation of dynamical characteristics of the mechanism with a personal computer (PC). In addition, in space field, it was suggested that the analytical modelings of thin film and thin board were carried out using continuous approximation. By making use of this model and by experimental estimation of initial & boundary conditions, it was possible for estimation approximately of fundamental mechanical quantities, such as displacement, acceleration and mechanical energy.
Keyword (in Japanese) (See Japanese page) 
(in English) electrical contact / hammering oscillating / mathematical model / continuous model / time field / space field / /  
Reference Info. IEICE Tech. Rep., vol. 109, no. 420, EMD2009-117, pp. 1-6, Feb. 2010.
Paper # EMD2009-117 
Date of Issue 2010-02-12 (R, EMD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee EMD R  
Conference Date 2010-02-19 - 2010-02-19 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EMD 
Conference Code 2010-02-EMD-R 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Degradation phenomenon of electrical contacts by hammering oscillating mechanism 
Sub Title (in English) Modeling of the oscillating mechanism (7) 
Keyword(1) electrical contact  
Keyword(2) hammering oscillating  
Keyword(3) mathematical model  
Keyword(4) continuous model  
Keyword(5) time field  
Keyword(6) space field  
Keyword(7)  
Keyword(8)  
1st Author's Name Shin-ichi Wada  
1st Author's Affiliation TMC System Co.Ltd. (TMC System Co.Ltd.)
2nd Author's Name Keiji Koshida  
2nd Author's Affiliation TMC System Co.Ltd. (TMC System Co.Ltd.)
3rd Author's Name Taketo Sonoda  
3rd Author's Affiliation TMC System Co.Ltd. (TMC System Co.Ltd.)
4th Author's Name Saindaa Norovling  
4th Author's Affiliation TMC System Co.Ltd. (TMC System Co.Ltd.)
5th Author's Name Mitsuo Kikuchi  
5th Author's Affiliation TMC System Co.Ltd. (TMC System Co.Ltd.)
6th Author's Name Hiroaki Kubota  
6th Author's Affiliation TMC System Co.Ltd. (TMC System Co.Ltd.)
7th Author's Name Koichiro Sawa  
7th Author's Affiliation Professor Emeritus Keio University/Nippon Institute of Technology (former Keio Univ/Nippon Inst. of Tech.)
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Speaker Author-1 
Date Time 2010-02-19 12:35:00 
Presentation Time 25 minutes 
Registration for EMD 
Paper # R2009-50, EMD2009-117 
Volume (vol) vol.109 
Number (no) no.419(R), no.420(EMD) 
Page pp.1-6 
#Pages 6 
Date of Issue 2010-02-12 (R, EMD) 

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