Paper Abstract and Keywords |
Presentation |
2010-05-21 14:50
Degradation phenomenon of electrical contacts by hammering oscillating mechanism
-- modeling of the oscillating mechanism (8) -- Shin-ichi Wada, Keiji Koshida, Taketo Sonoda, Saindaa Norovling, Masayoshi Kotabe, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2010-4 Link to ES Tech. Rep. Archives: EMD2010-4 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
The authors have developed the mechanism which gives vibration to electrical contacts by hammering oscillation and studied the influences of a micro-oscillation on the contacts. In time & space fields, by combinations of unit step functions as external force, it was suggested that mathematical approach was able to be compared with experimental data using continuous approximation to a thin plate. In consideration of friction force & inertial force generated in connectors it was suggested that another model was able to be compared with experimental data and to explain the degradation phenomenon of electrical contacts. By making use of these models and by initial & boundary conditions, it was suggested that the approximate estimation of fundamental mechanical quantities, such as displacement, acceleration and mechanical energy was able to be carried out. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
electrical contact / degradation phenomenon / hammering oscillating mechanism / micro-oscillation / frictional force / inertial force / mathematical model / |
Reference Info. |
IEICE Tech. Rep., vol. 110, no. 51, EMD2010-4, pp. 19-24, May 2010. |
Paper # |
EMD2010-4 |
Date of Issue |
2010-05-14 (EMD) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
EMD2010-4 Link to ES Tech. Rep. Archives: EMD2010-4 |
Conference Information |
Committee |
EMD |
Conference Date |
2010-05-21 - 2010-05-21 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Akita Univ. |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
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Paper Information |
Registration To |
EMD |
Conference Code |
2010-05-EMD |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Degradation phenomenon of electrical contacts by hammering oscillating mechanism |
Sub Title (in English) |
modeling of the oscillating mechanism (8) |
Keyword(1) |
electrical contact |
Keyword(2) |
degradation phenomenon |
Keyword(3) |
hammering oscillating mechanism |
Keyword(4) |
micro-oscillation |
Keyword(5) |
frictional force |
Keyword(6) |
inertial force |
Keyword(7) |
mathematical model |
Keyword(8) |
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1st Author's Name |
Shin-ichi Wada |
1st Author's Affiliation |
TMC System Co. Ltd. (TMC) |
2nd Author's Name |
Keiji Koshida |
2nd Author's Affiliation |
TMC System Co. Ltd. (TMC) |
3rd Author's Name |
Taketo Sonoda |
3rd Author's Affiliation |
TMC System Co. Ltd. (TMC) |
4th Author's Name |
Saindaa Norovling |
4th Author's Affiliation |
TMC System Co. Ltd. (TMC) |
5th Author's Name |
Masayoshi Kotabe |
5th Author's Affiliation |
TMC System Co. Ltd. (TMC) |
6th Author's Name |
Hiroaki Kubota |
6th Author's Affiliation |
TMC System Co. Ltd. (TMC) |
7th Author's Name |
Koichiro Sawa |
7th Author's Affiliation |
Nippon Institute of Technology (NIT) |
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Speaker |
Author-1 |
Date Time |
2010-05-21 14:50:00 |
Presentation Time |
25 minutes |
Registration for |
EMD |
Paper # |
EMD2010-4 |
Volume (vol) |
vol.110 |
Number (no) |
no.51 |
Page |
pp.19-24 |
#Pages |
6 |
Date of Issue |
2010-05-14 (EMD) |
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