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Paper Abstract and Keywords
Presentation 2010-06-25 16:45
Degradation phenomenon of electrical contacts by hammering oscillating mechanism -- Modeling of the sliding mechanism (1) --
Shin-ichi Wada, Keiji Koshida, Taketo Sonoda, Saindaa Norovling, Masayoshi Kotabe, Hiroaki Kubota (TMC), Koichiro Sawa (former Keio Univ/NIT) EMD2010-15 CPM2010-29 OME2010-34
Abstract (in Japanese) (See Japanese page) 
(in English) Authors measured increasing resistances on electrical contacts by means of sliding contact mechanism respectively on the conditions that (1) sliding forces were 2.0N/pin or 0.3N/pin and (2) sliding amplitudes were ±5.0μm or ±10.0μm under the operation number of about 25milions. It was suggested that there was potentiality to make a model of the tendencies of contact variations in the primary stages in the above cases. It was suggested that there was the expanded model with logistic function and periodical components applied to averaged data. It was studied that there were the parameters (sliding force and sliding amplitude) which caused the relative displacements to electrical contacts about the time-sequential fluctuations of the contact resistances. And it was suggested that the simplified fluctuation model would be applied to the fluctuation of contact resistance.
Keyword (in Japanese) (See Japanese page) 
(in English) electrical contact / micro-oscillation / contact resistance / sliding contact mechanism / sliding amplitude / sliding force / fluctuation /  
Reference Info. IEICE Tech. Rep., vol. 110, no. 99, EMD2010-15, pp. 37-42, June 2010.
Paper # EMD2010-15 
Date of Issue 2010-06-18 (EMD, CPM, OME) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
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reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMD2010-15 CPM2010-29 OME2010-34

Conference Information
Committee EMD CPM OME  
Conference Date 2010-06-25 - 2010-06-25 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Summer Meeting of materials and devices 
Paper Information
Registration To EMD 
Conference Code 2010-06-EMD-CPM-OME 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Degradation phenomenon of electrical contacts by hammering oscillating mechanism 
Sub Title (in English) Modeling of the sliding mechanism (1) 
Keyword(1) electrical contact  
Keyword(2) micro-oscillation  
Keyword(3) contact resistance  
Keyword(4) sliding contact mechanism  
Keyword(5) sliding amplitude  
Keyword(6) sliding force  
Keyword(7) fluctuation  
Keyword(8)  
1st Author's Name Shin-ichi Wada  
1st Author's Affiliation TMC System Co. Ltd. (TMC)
2nd Author's Name Keiji Koshida  
2nd Author's Affiliation TMC System Co. Ltd. (TMC)
3rd Author's Name Taketo Sonoda  
3rd Author's Affiliation TMC System Co. Ltd. (TMC)
4th Author's Name Saindaa Norovling  
4th Author's Affiliation TMC System Co. Ltd. (TMC)
5th Author's Name Masayoshi Kotabe  
5th Author's Affiliation TMC System Co. Ltd. (TMC)
6th Author's Name Hiroaki Kubota  
6th Author's Affiliation TMC System Co. Ltd. (TMC)
7th Author's Name Koichiro Sawa  
7th Author's Affiliation Professor Emeritus of Keio University/Nippon Institute of Technology (former Keio Univ/NIT)
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Speaker Author-1 
Date Time 2010-06-25 16:45:00 
Presentation Time 25 minutes 
Registration for EMD 
Paper # EMD2010-15, CPM2010-29, OME2010-34 
Volume (vol) vol.110 
Number (no) no.99(EMD), no.100(CPM), no.101(OME) 
Page pp.37-42 
#Pages 6 
Date of Issue 2010-06-18 (EMD, CPM, OME) 

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