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Paper Abstract and Keywords
Presentation 2010-07-02 11:35
The Impact of Current Controlled-MOS Current Mode Logic /Magnetic Tunnel Junction Hybrid Circuit for Stable and High-speed Operation
Tetsuo Endoh, Masashi Kamiyanagi, Masakazu Muraguchi, Takuya Imamoto, Takeshi Sasaki (Tohoku Univ.) ED2010-109 SDM2010-110 Link to ES Tech. Rep. Archives: ED2010-109 SDM2010-110
Abstract (in Japanese) (See Japanese page) 
(in English) In order to realize Integrated Circuits (IC) with operation over the 10GHz range, conventional CMOS logic face critical issues, such as increasing power consumption, and difficulty to aggressively scale the device size and so on. To overcome this issue, we have proposed Current Controlled-MOS Current Mode Logic (CC-MCML) to realize the reduction of power consumption and the enhancement of the operation speed in logic circuits without scaling the gate length of the MOSFET, and confirmed the performance of these circuits both theoretically and experimentally. In the CC-MCML it is extremely important to control the input voltage of the MOSFET used as the constant current source in order to make the base voltage of the input signal and the output signal equivalent. In this paper, we propose CC-MCML/MTJ (Magnetic Tunnel Junction) circuit, which is one type of nonvolatile memory hybrid circuit technology. A more stable and precise operation is realized by cutting the range of the input voltage of the constant current source, and it is shown that the operation of CC-MCML/MTJ Hybrid Circuit enables us to suppress the base voltage difference due to the Vth fluctuation in comparison with the conventional CC-MCML. These results imply the high potential of Si-CMOS/Spintronics Hybrid technologies for future IC.
Keyword (in Japanese) (See Japanese page) 
(in English) Current Controlled-MCML / MCML / Vth Fluctuation / Stability / NMOS / PMOS / MTJ / TMR  
Reference Info. IEICE Tech. Rep., vol. 110, no. 110, SDM2010-110, pp. 257-262, June 2010.
Paper # SDM2010-110 
Date of Issue 2010-06-23 (ED, SDM) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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Download PDF ED2010-109 SDM2010-110 Link to ES Tech. Rep. Archives: ED2010-109 SDM2010-110

Conference Information
Committee ED SDM  
Conference Date 2010-06-30 - 2010-07-02 
Place (in Japanese) (See Japanese page) 
Place (in English) Tokyo Inst. of Tech. Ookayama Campus 
Topics (in Japanese) (See Japanese page) 
Topics (in English) 2010 Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices 
Paper Information
Registration To SDM 
Conference Code 2010-06-ED-SDM 
Language English 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) The Impact of Current Controlled-MOS Current Mode Logic /Magnetic Tunnel Junction Hybrid Circuit for Stable and High-speed Operation 
Sub Title (in English)  
Keyword(1) Current Controlled-MCML  
Keyword(2) MCML  
Keyword(3) Vth Fluctuation  
Keyword(4) Stability  
Keyword(5) NMOS  
Keyword(6) PMOS  
Keyword(7) MTJ  
Keyword(8) TMR  
1st Author's Name Tetsuo Endoh  
1st Author's Affiliation Tohoku University (Tohoku Univ.)
2nd Author's Name Masashi Kamiyanagi  
2nd Author's Affiliation Tohoku University (Tohoku Univ.)
3rd Author's Name Masakazu Muraguchi  
3rd Author's Affiliation Tohoku University (Tohoku Univ.)
4th Author's Name Takuya Imamoto  
4th Author's Affiliation Tohoku University (Tohoku Univ.)
5th Author's Name Takeshi Sasaki  
5th Author's Affiliation Tohoku University (Tohoku Univ.)
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Speaker Author-1 
Date Time 2010-07-02 11:35:00 
Presentation Time 15 minutes 
Registration for SDM 
Paper # ED2010-109, SDM2010-110 
Volume (vol) vol.110 
Number (no) no.109(ED), no.110(SDM) 
Page pp.257-262 
#Pages
Date of Issue 2010-06-23 (ED, SDM) 


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