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Paper Abstract and Keywords
Presentation 2010-07-16 12:35
Degradation phenomenon of electrical contacts by hammering oscillating mechanism -- Contact Resistance (13) --
Shin-ichi Wada, Taketo Sonoda, Keiji Koshida, Saindaa Norovling, Masayoshi Kotabe, Hiroaki Kubota (TMC), Koichiro Sawa (Nippon Inst. of Tech.) EMCJ2010-32 EMD2010-17
Abstract (in Japanese) (See Japanese page) 
(in English) Authors studied the influence on contact resistance by micro-vibration to electrical contacts using hammering oscillation mechanism. In this paper, SD memory cards used in the mobile machinery for auxiliary storage unit were used as experimental materials because of the necessity of analysis about characteristics for oscillation. As a result of the experiment, it was shown that there was degradation phenomenon of electrical contacts after 20 millions hammerings and correlation between fluctuation of contact resistance and condition of contact surface. It was suggested that there was the influence on contact resistance by micro-vibration.
Keyword (in Japanese) (See Japanese page) 
(in English) electrical contact / micro-oscillation / contact resistance / hammering oscillating mechanism / contact force / SD memory card / /  
Reference Info. IEICE Tech. Rep., vol. 110, no. 133, EMD2010-17, pp. 1-6, July 2010.
Paper # EMD2010-17 
Date of Issue 2010-07-09 (EMCJ, EMD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMCJ2010-32 EMD2010-17

Conference Information
Committee EMCJ EMD  
Conference Date 2010-07-16 - 2010-07-16 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Electric discharge, Packaging, EMC, etc. 
Paper Information
Registration To EMD 
Conference Code 2010-07-EMCJ-EMD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Degradation phenomenon of electrical contacts by hammering oscillating mechanism 
Sub Title (in English) Contact Resistance (13) 
Keyword(1) electrical contact  
Keyword(2) micro-oscillation  
Keyword(3) contact resistance  
Keyword(4) hammering oscillating mechanism  
Keyword(5) contact force  
Keyword(6) SD memory card  
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Keyword(8)  
1st Author's Name Shin-ichi Wada  
1st Author's Affiliation TMC System co. jp. (TMC)
2nd Author's Name Taketo Sonoda  
2nd Author's Affiliation TMC System co. jp. (TMC)
3rd Author's Name Keiji Koshida  
3rd Author's Affiliation TMC System co. jp. (TMC)
4th Author's Name Saindaa Norovling  
4th Author's Affiliation TMC System co. jp. (TMC)
5th Author's Name Masayoshi Kotabe  
5th Author's Affiliation TMC System co. jp. (TMC)
6th Author's Name Hiroaki Kubota  
6th Author's Affiliation TMC System co. jp. (TMC)
7th Author's Name Koichiro Sawa  
7th Author's Affiliation Nippon Institute of Technology (Nippon Inst. of Tech.)
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Speaker Author-2 
Date Time 2010-07-16 12:35:00 
Presentation Time 25 minutes 
Registration for EMD 
Paper # EMCJ2010-32, EMD2010-17 
Volume (vol) vol.110 
Number (no) no.132(EMCJ), no.133(EMD) 
Page pp.1-6 
#Pages 6 
Date of Issue 2010-07-09 (EMCJ, EMD) 

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