IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2010-07-30 13:40
Dynamic Fault Tree Analysis by using Cut Sequence Sets
Taijirou Yoneda, Tetsushi Yuge, Nobuyuki Tamura, Shigeru Yanagi (NDA) R2010-18
Abstract (in Japanese) (See Japanese page) 
(in English) We propose a method of calculating the top event probability of a fault tree with priority AND gates using the minimal cut sets. At first, using new operators which have been defined by Merle, we present the algebraic forms of the minimal cut sequence set. Secondly, we obtain the concrete sequences of a minimal cut sequence by Abraham’s theory. The probabilities of the cut sequences are calculated by a Markov based formula. Finally, we calculate the top event probability of an FT using the probabilities of cut sequences.
Keyword (in Japanese) (See Japanese page) 
(in English) Dynamic FT / Priority AND Gate / Top event probability / Abraham’s theory / / / /  
Reference Info. IEICE Tech. Rep., vol. 110, no. 159, R2010-18, pp. 7-12, July 2010.
Paper # R2010-18 
Date of Issue 2010-07-23 (R) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF R2010-18

Conference Information
Committee R  
Conference Date 2010-07-30 - 2010-07-30 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To R 
Conference Code 2010-07-R 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Dynamic Fault Tree Analysis by using Cut Sequence Sets 
Sub Title (in English)  
Keyword(1) Dynamic FT  
Keyword(2) Priority AND Gate  
Keyword(3) Top event probability  
Keyword(4) Abraham’s theory  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Taijirou Yoneda  
1st Author's Affiliation National Defense Academy (NDA)
2nd Author's Name Tetsushi Yuge  
2nd Author's Affiliation National Defense Academy (NDA)
3rd Author's Name Nobuyuki Tamura  
3rd Author's Affiliation National Defense Academy (NDA)
4th Author's Name Shigeru Yanagi  
4th Author's Affiliation National Defense Academy (NDA)
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2010-07-30 13:40:00 
Presentation Time 25 minutes 
Registration for R 
Paper # R2010-18 
Volume (vol) vol.110 
Number (no) no.159 
Page pp.7-12 
#Pages
Date of Issue 2010-07-23 (R) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan