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Paper Abstract and Keywords
Presentation 2010-07-30 13:00
Evaluation of Bending Characteristics in Silicon Wires Using Three-Dimensional Frequency-Domain Vectorial Finite Element Method
Satoshi Kaise, Yuki Kawaguchi, Kunimasa Saitoh, Masanori Koshiba (Hokkaido Univ.) MW2010-62 OPE2010-47
Abstract (in Japanese) (See Japanese page) 
(in English) Silicon wires can achieve a strong optical confinement according to the high refractive index difference between the core and cladding material. Therefore, it is expected that they can reduce the size of optical circuits based on conventional silica waveguides. In general, optical circuits are composed of numbers of bent waveguides connected with straight waveguides. In order to evaluate propagation characteristics of such waveguides, we have to consider mismatch of the mode field between bent waveguides and straight waveguides. In this work, we evaluate bending characteristics of silicon wires with a newly developed three-dimensional vectorial finite element method.
Keyword (in Japanese) (See Japanese page) 
(in English) Silicon wires / Finite Element Method / Bending loss / / / / /  
Reference Info. IEICE Tech. Rep., vol. 110, no. 156, OPE2010-47, pp. 205-210, July 2010.
Paper # OPE2010-47 
Date of Issue 2010-07-22 (MW, OPE) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF MW2010-62 OPE2010-47

Conference Information
Committee EMT OPE MW IEE-EMT  
Conference Date 2010-07-29 - 2010-07-30 
Place (in Japanese) (See Japanese page) 
Place (in English) Hokkaido Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To OPE 
Conference Code 2010-07-EMT-OPE-MW-EMT 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Evaluation of Bending Characteristics in Silicon Wires Using Three-Dimensional Frequency-Domain Vectorial Finite Element Method 
Sub Title (in English)  
Keyword(1) Silicon wires  
Keyword(2) Finite Element Method  
Keyword(3) Bending loss  
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1st Author's Name Satoshi Kaise  
1st Author's Affiliation Hokkido University (Hokkaido Univ.)
2nd Author's Name Yuki Kawaguchi  
2nd Author's Affiliation Hokkido University (Hokkaido Univ.)
3rd Author's Name Kunimasa Saitoh  
3rd Author's Affiliation Hokkido University (Hokkaido Univ.)
4th Author's Name Masanori Koshiba  
4th Author's Affiliation Hokkido University (Hokkaido Univ.)
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Speaker Author-1 
Date Time 2010-07-30 13:00:00 
Presentation Time 25 minutes 
Registration for OPE 
Paper # MW2010-62, OPE2010-47 
Volume (vol) vol.110 
Number (no) no.155(MW), no.156(OPE) 
Page pp.205-210 
#Pages 6 
Date of Issue 2010-07-22 (MW, OPE) 

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