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Paper Abstract and Keywords
Presentation 2010-08-27 09:00
Post-manufacturing, 17-times Acceptable Raw Bit Error Rate Enhancement, Dynamic Codeword Transition ECC Scheme for Highly Reliable Solid-State Drives, SSDs
Shuhei Tanakamaru (Univ. of Tokyo), Atsushi Esumi, Mitsuyoshi Ito, Kai Li (SIGLEAD), Ken Takeuchi (Univ. of Tokyo) SDM2010-138 ICD2010-53
Abstract (in Japanese) (See Japanese page) 
(in English) A dynamic codeword transition ECC scheme is proposed for highly reliable solid-state drives, SSDs. By monitoring the error number or the write / erase cycles, the ECC codeword dynamically increases from 512Byte (+parity) to 1KByte, 2KByte, 4KByte…32KByte. The proposed ECC with a larger codeword decreases the failure rate after ECC. Because the parity rate per codeword is the same in each ECC codeword, no additional memory area is required so that the reliability of SSD is improved after the manufacturing without cost penalty. Compared with the conventional ECC with the fixed large 32KByte codeword, the proposed scheme achieves a lower power consumption by introducing the “best-effort” type operation.
Keyword (in Japanese) (See Japanese page) 
(in English) ECC / Error correcting code / SSD / NAND Flash memory / / / /  
Reference Info. IEICE Tech. Rep., vol. 110, no. 183, ICD2010-53, pp. 77-82, Aug. 2010.
Paper # ICD2010-53 
Date of Issue 2010-08-19 (SDM, ICD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF SDM2010-138 ICD2010-53

Conference Information
Committee ICD SDM  
Conference Date 2010-08-26 - 2010-08-27 
Place (in Japanese) (See Japanese page) 
Place (in English) Sapporo Center for Gender Equality 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Low voltage/low power techniques, novel devices, circuits, and applications 
Paper Information
Registration To ICD 
Conference Code 2010-08-ICD-SDM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Post-manufacturing, 17-times Acceptable Raw Bit Error Rate Enhancement, Dynamic Codeword Transition ECC Scheme for Highly Reliable Solid-State Drives, SSDs 
Sub Title (in English)  
Keyword(1) ECC  
Keyword(2) Error correcting code  
Keyword(3) SSD  
Keyword(4) NAND Flash memory  
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1st Author's Name Shuhei Tanakamaru  
1st Author's Affiliation University of Tokyo (Univ. of Tokyo)
2nd Author's Name Atsushi Esumi  
2nd Author's Affiliation SIGLEAD (SIGLEAD)
3rd Author's Name Mitsuyoshi Ito  
3rd Author's Affiliation SIGLEAD (SIGLEAD)
4th Author's Name Kai Li  
4th Author's Affiliation SIGLEAD (SIGLEAD)
5th Author's Name Ken Takeuchi  
5th Author's Affiliation University of Tokyo (Univ. of Tokyo)
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Speaker Author-1 
Date Time 2010-08-27 09:00:00 
Presentation Time 25 minutes 
Registration for ICD 
Paper # SDM2010-138, ICD2010-53 
Volume (vol) vol.110 
Number (no) no.182(SDM), no.183(ICD) 
Page pp.77-82 
#Pages 6 
Date of Issue 2010-08-19 (SDM, ICD) 

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