Paper Abstract and Keywords |
Presentation |
2010-08-27 17:45
Incident-Power-Dependent Extinction Ratio of 1.3-um Electroabsorption Modulator Integrated with DFB laser: Theory and Experiment Takeshi Fujisawa, Takayuki Yamanaka, Takashi Tadokoro, Naoki Fujiwara, Masakazu Arai, Wataru Kobayashi, Yoshihiro Kawaguchi, Ken Tsuzuki, Fumiyoshi Kano (NTT) EMD2010-61 CPM2010-77 OPE2010-86 LQE2010-59 Link to ES Tech. Rep. Archives: EMD2010-61 CPM2010-77 OPE2010-86 LQE2010-59 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
We have found that the extinction ratio of an electroabsorption modulator integrated with DFB laser strongly depends on the incident power to the modulator. Our theoretical consideration based on the full device simulation reveals that the temperature change in the modulator dominates the phenomenon. To obtain the intrinsic extinction characteristics of the modulator, a microscopic theory, which takes into account quantum mechanical many-body interactions in semiconductors, is used to exclude unknown experimental fitting parameters. Heat-flux analysis is performed for the calculation of the temperature distribution in the entire device. As the incident power to the modulator increases, the photo-current is also increased, leading to the increase in the temperature of the modulator by some tens of degrees Celsius induced by Joule heating. The increase red-shifts the absorption spectrum of the modulator and the detuning, which is the difference between a lasing wavelength and a band-edge wavelength of the modulator, becomes small, leading to larger extinction ratio. Calculated results are in good agreement with the experiment showing the validity of our discussion, and indicate that the extinction ratio of electroabsorption modulators is strongly affected by the internal heating of the device. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Electroabsorption modulator / quantum well / many-body theory / heat-flux analysis / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 110, no. 181, LQE2010-59, pp. 163-168, Aug. 2010. |
Paper # |
LQE2010-59 |
Date of Issue |
2010-08-19 (EMD, CPM, OPE, LQE) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
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EMD2010-61 CPM2010-77 OPE2010-86 LQE2010-59 Link to ES Tech. Rep. Archives: EMD2010-61 CPM2010-77 OPE2010-86 LQE2010-59 |
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