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Paper Abstract and Keywords
Presentation 2010-08-27 15:35
Pattern Layout Methods of System LSI with SGT
Takahiro Kodama, Shigeyoshi Watanabe (Shonan Inst. of Tech.) SDM2010-149 ICD2010-64 Link to ES Tech. Rep. Archives: SDM2010-149 ICD2010-64
Abstract (in Japanese) (See Japanese page) 
(in English) The pattern area reduction of inverter, NAND, and full adder with SGT and stacked SGT has been ‘newly’ estimated. Wring SGT and stacked SGT the pattern area can be drastically reduced compared with that of conventional planar transistor, SGT and stacked SGT are promising candidate for reeling high density system LSI.
Keyword (in Japanese) (See Japanese page) 
(in English) SGT / stacked SGT / system LSI / design rule / pattern area / / /  
Reference Info. IEICE Tech. Rep., vol. 110, no. 182, SDM2010-149, pp. 137-142, Aug. 2010.
Paper # SDM2010-149 
Date of Issue 2010-08-19 (SDM, ICD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF SDM2010-149 ICD2010-64 Link to ES Tech. Rep. Archives: SDM2010-149 ICD2010-64

Conference Information
Committee ICD SDM  
Conference Date 2010-08-26 - 2010-08-27 
Place (in Japanese) (See Japanese page) 
Place (in English) Sapporo Center for Gender Equality 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Low voltage/low power techniques, novel devices, circuits, and applications 
Paper Information
Registration To SDM 
Conference Code 2010-08-ICD-SDM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Pattern Layout Methods of System LSI with SGT 
Sub Title (in English)  
Keyword(1) SGT  
Keyword(2) stacked SGT  
Keyword(3) system LSI  
Keyword(4) design rule  
Keyword(5) pattern area  
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1st Author's Name Takahiro Kodama  
1st Author's Affiliation Shonan Institute of Technology (Shonan Inst. of Tech.)
2nd Author's Name Shigeyoshi Watanabe  
2nd Author's Affiliation Shonan Institute of Technology (Shonan Inst. of Tech.)
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Speaker Author-1 
Date Time 2010-08-27 15:35:00 
Presentation Time 25 minutes 
Registration for SDM 
Paper # SDM2010-149, ICD2010-64 
Volume (vol) vol.110 
Number (no) no.182(SDM), no.183(ICD) 
Page pp.137-142 
#Pages
Date of Issue 2010-08-19 (SDM, ICD) 


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