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Paper Abstract and Keywords
Presentation 2010-09-28 15:25
Measurement Circuits for Acquiring SET PulseWidth Distribution with Fine Time Resolution
Ryo Harada, Yukio Mitsuyama, Masanori Hashimoto, Takao Onoye (Osaka Univ.) VLD2010-55
Abstract (in Japanese) (See Japanese page) 
(in English) This paper presents two circuits to measure pulse width distribution of
single event transients (SETs). We first review requirements for SET measurement in accelerated neutron radiation test and point out problems of previous works, in terms of time resolution, time/area efficiency for obtaining large samples and certainty in absolute values of pulse width. We then devise two measurement circuits and a pulse generator circuit that
satisfy all the requirements and attain sub-FO1-inverter-delay resolution, and propose a measurement procedure for assuring the absolute width values. Operation of one of the proposed circuits was confirmed by a radiation experiment of alpha particles with a fabricated test chip.
Keyword (in Japanese) (See Japanese page) 
(in English) soft error / single event transient (SET) / pulse width / measurement circuit / / / /  
Reference Info. IEICE Tech. Rep., vol. 110, no. 210, VLD2010-55, pp. 77-82, Sept. 2010.
Paper # VLD2010-55 
Date of Issue 2010-09-20 (VLD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF VLD2010-55

Conference Information
Committee VLD  
Conference Date 2010-09-27 - 2010-09-28 
Place (in Japanese) (See Japanese page) 
Place (in English) Kyoto Institute of Technology 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Physical design, etc 
Paper Information
Registration To VLD 
Conference Code 2010-09-VLD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Measurement Circuits for Acquiring SET PulseWidth Distribution with Fine Time Resolution 
Sub Title (in English)  
Keyword(1) soft error  
Keyword(2) single event transient (SET)  
Keyword(3) pulse width  
Keyword(4) measurement circuit  
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Keyword(8)  
1st Author's Name Ryo Harada  
1st Author's Affiliation Osaka University (Osaka Univ.)
2nd Author's Name Yukio Mitsuyama  
2nd Author's Affiliation Osaka University (Osaka Univ.)
3rd Author's Name Masanori Hashimoto  
3rd Author's Affiliation Osaka University (Osaka Univ.)
4th Author's Name Takao Onoye  
4th Author's Affiliation Osaka University (Osaka Univ.)
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Speaker Author-1 
Date Time 2010-09-28 15:25:00 
Presentation Time 25 minutes 
Registration for VLD 
Paper # VLD2010-55 
Volume (vol) vol.110 
Number (no) no.210 
Page pp.77-82 
#Pages 6 
Date of Issue 2010-09-20 (VLD) 

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