Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information		 Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2010-10-09 15:40
Detection of REM Cycle for Evaluating Quality of Sleep
Tsuyoshi Moriyama, Yoshikazu Kobayashi, Shin Sakamoto (Tokyo Polytechnic Univ.) PRMU2010-109 SP2010-65 WIT2010-53
Abstract (in Japanese) (See Japanese page) 
(in English) Sleep consists of five stages including REM (one of them) and Non-REM sleep (four of the rest) that repeat. It is referred to as sleep cycle. When sleep cycle occurs periodically every 90 to 100 minutes, the quality of sleep is regarded good. For measuring the quality of sleep, many non-invasive and contact-free methods have been proposed in the past, yet with conditions on imaging device and mattress. We propose a method of estimating eye movements using image analysis of eyelids of a sleeping person. The proposed method analyzes infrared image of eyelid region and detects a specific pattern of the region caused from rapid eye movements. Experimental results on a realistic setting are reported.
Keyword (in Japanese) (See Japanese page) 
(in English) sleep / eye movements / image pattern analysis / facial expression / / / /  
Reference Info. IEICE Tech. Rep., vol. 110, no. 219, PRMU2010-109, pp. 111-113, Oct. 2010.
Paper # PRMU2010-109 
Date of Issue 2010-10-01 (PRMU, SP, WIT) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF PRMU2010-109 SP2010-65 WIT2010-53

Conference Information
Committee PRMU SP WIT  
Conference Date 2010-10-08 - 2010-10-09 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To PRMU 
Conference Code 2010-10-PRMU-SP-WIT 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Detection of REM Cycle for Evaluating Quality of Sleep 
Sub Title (in English)  
Keyword(1) sleep  
Keyword(2) eye movements  
Keyword(3) image pattern analysis  
Keyword(4) facial expression  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Tsuyoshi Moriyama  
1st Author's Affiliation Tokyo Polytechnic University (Tokyo Polytechnic Univ.)
2nd Author's Name Yoshikazu Kobayashi  
2nd Author's Affiliation Tokyo Polytechnic University (Tokyo Polytechnic Univ.)
3rd Author's Name Shin Sakamoto  
3rd Author's Affiliation Tokyo Polytechnic University (Tokyo Polytechnic Univ.)
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2010-10-09 15:40:00 
Presentation Time 30 minutes 
Registration for PRMU 
Paper # PRMU2010-109, SP2010-65, WIT2010-53 
Volume (vol) vol.110 
Number (no) no.219(PRMU), no.220(SP), no.221(WIT) 
Page pp.111-113 
#Pages 3 
Date of Issue 2010-10-01 (PRMU, SP, WIT) 

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan