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Paper Abstract and Keywords
Presentation 2010-10-22 10:35
Calibration Technique for Dielectric Permittivity Measurement in Scattered-Waves Method
Takashi Komakine, Takahiro Kurosawa (Akita Prefectural R&D Center), Hiroshi Inoue (Akita Univ.) EMCJ2010-64 MW2010-99 Link to ES Tech. Rep. Archives: MW2010-99
Abstract (in Japanese) (See Japanese page) 
(in English) To estimate the dielectric permittivity in high frequency, a method measuring the field strength of scattered waves re-radiated from the dielectric sample placed in a applied well-known field was proposed. This method can easily estimate the dielectric permittivity without contact in small sample size compared to the wavelength. The permittivity of the pure water which radiates the relatively larger scattered waves is estimated in order to certify the measurement principle. The sample is enclosed by spherical rubber in diameter of 80 mm and the scattered field is discriminated from applied field by absorbers arranged between transmitting and receiving antennas. For the samples which have the relatively small dielectric permittivity, the scheme which modulates the strength of scattered waves by mechanical vibrations to discriminate the scattered field superposed with the applied electric field and the coherent approach in receiving process, is introduced. In this case, the calibration technique using the calibrator whose volume, shape and dielectric permittivity are well-known is available practically. At the field frequency, 1 GHz, the dielectric permittivity of spherical Teflon of 20-mm diameter can be estimated with the error of 2 percents when the measuring system is calibrated by the Alumina calibrator of the same diameter.
Keyword (in Japanese) (See Japanese page) 
(in English) permittivity / dielectric constant / scatterer / modulated scattering / dielectric / calibration / /  
Reference Info. IEICE Tech. Rep., vol. 110, no. 236, EMCJ2010-64, pp. 73-76, Oct. 2010.
Paper # EMCJ2010-64 
Date of Issue 2010-10-14 (EMCJ, MW) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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Download PDF EMCJ2010-64 MW2010-99 Link to ES Tech. Rep. Archives: MW2010-99

Conference Information
Committee MW EMCJ  
Conference Date 2010-10-21 - 2010-10-22 
Place (in Japanese) (See Japanese page) 
Place (in English) Akita Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Microwave Technologies, EMC, etc. 
Paper Information
Registration To EMCJ 
Conference Code 2010-10-EMCJ-MW 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Calibration Technique for Dielectric Permittivity Measurement in Scattered-Waves Method 
Sub Title (in English)  
Keyword(1) permittivity  
Keyword(2) dielectric constant  
Keyword(3) scatterer  
Keyword(4) modulated scattering  
Keyword(5) dielectric  
Keyword(6) calibration  
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Keyword(8)  
1st Author's Name Takashi Komakine  
1st Author's Affiliation Akita Prefectural R&D Center (Akita Prefectural R&D Center)
2nd Author's Name Takahiro Kurosawa  
2nd Author's Affiliation Akita Prefectural R&D Center (Akita Prefectural R&D Center)
3rd Author's Name Hiroshi Inoue  
3rd Author's Affiliation Akita University (Akita Univ.)
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Speaker Author-1 
Date Time 2010-10-22 10:35:00 
Presentation Time 25 minutes 
Registration for EMCJ 
Paper # EMCJ2010-64, MW2010-99 
Volume (vol) vol.110 
Number (no) no.236(EMCJ), no.237(MW) 
Page pp.73-76 
#Pages
Date of Issue 2010-10-14 (EMCJ, MW) 


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