Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information		 Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2010-10-28 16:00
[Invited Talk] Cryogenic readout electronics for space borne far-infrared image sensors
Hirohisa Nagata, Takehiko Wada, Hirokazu Ikeda (JAXA), Yasuo Arai (KEK), Morifumi Ohno (AIST) SANE2010-108
Abstract (in Japanese) (See Japanese page) 
(in English) We have been developing low power cryogenic readout electronics for space borne large format far-infrared image sensors. As the circuit elements, a fully-depleted-silicon-on-insulator (FD-SOI) CMOS process was selected because they keep good static performance even at 4.2 K where many bulk-CMOS transistors suffer from anomalous behaviors. We have designed and fabricated several test circuits with the FD-SOI CMOS process and confirmed that a operational amplifier successfully operates with open loop gain to be over 1000 and with power consumption to be around 1.3μW as designed. In our presentation, we will make a report on some measurement results of the test circuits.
Keyword (in Japanese) (See Japanese page) 
(in English) Far-infrared Astronomy / Cryogenic readout electronics / charge amplifier / VLSI / FD-SOI-CMOS / / /  
Reference Info. IEICE Tech. Rep., vol. 110, no. 250, SANE2010-108, pp. 229-234, Oct. 2010.
Paper # SANE2010-108 
Date of Issue 2010-10-20 (SANE) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF SANE2010-108

Conference Information
Committee SANE  
Conference Date 2010-10-27 - 2010-10-29 
Place (in Japanese) (See Japanese page) 
Place (in English) Ramada Hotel, Jeju-do, Korea 
Topics (in Japanese) (See Japanese page) 
Topics (in English) ICSANE 2010 (International Conference on Space, Aeronautical and Navigational Electronics) 
Paper Information
Registration To SANE 
Conference Code 2010-10-SANE 
Language English (Japanese title is available) 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Cryogenic readout electronics for space borne far-infrared image sensors 
Sub Title (in English)  
Keyword(1) Far-infrared Astronomy  
Keyword(2) Cryogenic readout electronics  
Keyword(3) charge amplifier  
Keyword(4) VLSI  
Keyword(5) FD-SOI-CMOS  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Hirohisa Nagata  
1st Author's Affiliation Japan Aerospace Exploration Agency (JAXA)
2nd Author's Name Takehiko Wada  
2nd Author's Affiliation Japan Aerospace Exploration Agency (JAXA)
3rd Author's Name Hirokazu Ikeda  
3rd Author's Affiliation Japan Aerospace Exploration Agency (JAXA)
4th Author's Name Yasuo Arai  
4th Author's Affiliation High Energy Accelerator Research Organization (KEK)
5th Author's Name Morifumi Ohno  
5th Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2010-10-28 16:00:00 
Presentation Time 20 minutes 
Registration for SANE 
Paper # SANE2010-108 
Volume (vol) vol.110 
Number (no) no.250 
Page pp.229-234 
#Pages 6 
Date of Issue 2010-10-20 (SANE) 

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan