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Paper Abstract and Keywords
Presentation 2010-11-12 16:00
Study on test technology of electrical life for low-voltage circuit breaker
Li Kui, Huang Shaopo, Li Wenhua, Yuan Jinli (Hebei Univ. of Tech.), Zhang Gang (Changcheng Electrical Equipment Group), Shi Cunming (Yueqing Jingtai Test Equipment) EMD2010-121
Abstract (in Japanese) (See Japanese page) 
(in English) Test technology of life for low-voltage circuit breaker is studied, including mechanical life and electrical life. A computer-based device of life test is developed with modularized software design. Real-time detecting circuit is designed to monitor voltage and current so that automatic fault diagnosis of circuit breaker can be implemented and damages of power supply or load caused by contact welding or mechanical sticking of circuit breaker can be avoided. Either moulded case circuit breaker or miniature circuit breaker can be tested, which improves test efficiency and provides an effective means for research of on-line prediction of reliability for circuit breaker.
Keyword (in Japanese) (See Japanese page) 
(in English) Circuit breaker / Life test / Detecting technology / Automatic fault diagnosis / / / /  
Reference Info. IEICE Tech. Rep., vol. 110, no. 270, EMD2010-121, pp. 227-230, Nov. 2010.
Paper # EMD2010-121 
Date of Issue 2010-11-04 (EMD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMD2010-121

Conference Information
Committee EMD  
Conference Date 2010-11-11 - 2010-11-12 
Place (in Japanese) (See Japanese page) 
Place (in English) Xi'an Jiaotong University 
Topics (in Japanese) (See Japanese page) 
Topics (in English) IS-EMD2010 (10th International Session in Electro-Mechanical Devices) 
Paper Information
Registration To EMD 
Conference Code 2010-11-EMD 
Language English 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Study on test technology of electrical life for low-voltage circuit breaker 
Sub Title (in English)  
Keyword(1) Circuit breaker  
Keyword(2) Life test  
Keyword(3) Detecting technology  
Keyword(4) Automatic fault diagnosis  
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1st Author's Name Li Kui  
1st Author's Affiliation Hebei University of Technology (Hebei Univ. of Tech.)
2nd Author's Name Huang Shaopo  
2nd Author's Affiliation Hebei University of Technology (Hebei Univ. of Tech.)
3rd Author's Name Li Wenhua  
3rd Author's Affiliation Hebei University of Technology (Hebei Univ. of Tech.)
4th Author's Name Yuan Jinli  
4th Author's Affiliation Hebei University of Technology (Hebei Univ. of Tech.)
5th Author's Name Zhang Gang  
5th Author's Affiliation Changcheng Electrical Equipment Group (Changcheng Electrical Equipment Group)
6th Author's Name Shi Cunming  
6th Author's Affiliation Yueqing Jingtai Test Equipment (Yueqing Jingtai Test Equipment)
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Speaker Author-1 
Date Time 2010-11-12 16:00:00 
Presentation Time 15 minutes 
Registration for EMD 
Paper # EMD2010-121 
Volume (vol) vol.110 
Number (no) no.270 
Page pp.227-230 
#Pages 4 
Date of Issue 2010-11-04 (EMD) 

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