Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information		 Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2010-11-12 14:30
Characteristics of electric charges carried by dust particles and their effects on electrical contact failures
Jinchun Gao (Beijing Univ. of Posts and Telecom.) EMD2010-116
Abstract (in Japanese) (See Japanese page) 
(in English) Dust contamination is one of the major causes of electrical contact failure. The deposition of dust and adhesion of particles are affected by the electric charges carried by the dust particles. This paper describes characteristics of electric charges carried by dust particles and their effects on electrical contact failure. A Millikan testing method was used for measuring the electric charges. The results show that the variation of electric charges carried by dust particles is located in a band region, the trend of charges can be expressed as a third order equation, the results obtained for positive and negative charge are similar. The morphology and surface seem to be the major factors which influence the electric charge. The relative humidity of the environment greatly affects the amount of electric charge. It is found that dust particles carry negative charges or positive charges, those particles will be attracted to both electric contact surfaces respectively, and thereby the probability of causing electrical contact failure is greatly increased. The selective deposition of particle takes place on electrical contact surface. The failed connectors were characterized by using SEM/EDS. Serious contaminants were detected at the contact interfaces, and the contaminants contained the major elements of dust, namely Si, and Al. Dust particles depositing at contact sports can cause electrical contact failure. They can also result in forming tiny holes in the Au film during plating process as well as influencing Au film adhesion. Appropriately controlling the environmental humidity during operation of the electro-mechanical components and protecting the contact interface from dust can effectively lower electrical contact failure.
Keyword (in Japanese) (See Japanese page) 
(in English) Dust particles / Electric charge / Contamination / Contact failure / / / /  
Reference Info. IEICE Tech. Rep., vol. 110, no. 270, EMD2010-116, pp. 205-210, Nov. 2010.
Paper # EMD2010-116 
Date of Issue 2010-11-04 (EMD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMD2010-116

Conference Information
Committee EMD  
Conference Date 2010-11-11 - 2010-11-12 
Place (in Japanese) (See Japanese page) 
Place (in English) Xi'an Jiaotong University 
Topics (in Japanese) (See Japanese page) 
Topics (in English) IS-EMD2010 (10th International Session in Electro-Mechanical Devices) 
Paper Information
Registration To EMD 
Conference Code 2010-11-EMD 
Language English 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Characteristics of electric charges carried by dust particles and their effects on electrical contact failures 
Sub Title (in English)  
Keyword(1) Dust particles  
Keyword(2) Electric charge  
Keyword(3) Contamination  
Keyword(4) Contact failure  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Jinchun Gao  
1st Author's Affiliation Beijing University of Posts and Telecommunications (Beijing Univ. of Posts and Telecom.)
2nd Author's Name  
2nd Author's Affiliation ()
3rd Author's Name  
3rd Author's Affiliation ()
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2010-11-12 14:30:00 
Presentation Time 15 minutes 
Registration for EMD 
Paper # EMD2010-116 
Volume (vol) vol.110 
Number (no) no.270 
Page pp.205-210 
#Pages 6 
Date of Issue 2010-11-04 (EMD) 

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan