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Paper Abstract and Keywords
Presentation 2010-12-10 14:55
Quantification of Small Devices using EMI Test Instrument with Microstripline Structure
Erika Kawabata (PPL), Kazuyuki Sakiyama, Toru Yamada (Panasonic), Toshihiko Taniguchi (PPL) EMCJ2010-94
Abstract (in Japanese) (See Japanese page) 
(in English) Recently, a great demand for the execution of EMC tests to electric small devices has increased. In this paper, novel measuring method for EMI observation of electric device radiation noise is proposed. The instrument is constructed by microstripline structure which have been already applied for our EMS testing. It has high sensitivity for weak noise power and effective to use multi-usage EMC evaluation. At first, the noise detection performance of this instrument by measuring the small emission noise quantitatively is evaluated, and this maicrostripline structure get better performance compared to the ordinary TEM cell instrument. Next, by using of standard antenna model which approximate noise source, the noise detection performance is evaluated by experiment and analysis from 30MHz to 2.5GHz band. Furthermore, less than 500MHz band, the noise detection performance depends on formdevice shape and position, because of capacitance coupling between microstripline and DUT. Finally, the calibration method for noise quantification is proposed. This EMI evaluation method using the test instrument of the microstripline structure is very effective as well as EMS evaluation.
Keyword (in Japanese) (See Japanese page) 
(in English) EMC / Microstripline / TEM mode / Magnetic field coupling / Electric field coupling / / /  
Reference Info. IEICE Tech. Rep., vol. 110, no. 332, EMCJ2010-94, pp. 75-80, Dec. 2010.
Paper # EMCJ2010-94 
Date of Issue 2010-12-03 (EMCJ) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee EMCJ IEE-EMC  
Conference Date 2010-12-10 - 2010-12-10 
Place (in Japanese) (See Japanese page) 
Place (in English) Chukyo Univ. Toyoda Campus 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Electric Power, EMC, etc. 
Paper Information
Registration To EMCJ 
Conference Code 2010-12-EMCJ-EMC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Quantification of Small Devices using EMI Test Instrument with Microstripline Structure 
Sub Title (in English)  
Keyword(1) EMC  
Keyword(2) Microstripline  
Keyword(3) TEM mode  
Keyword(4) Magnetic field coupling  
Keyword(5) Electric field coupling  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Erika Kawabata  
1st Author's Affiliation Panasonic Photo & Lighting Co., Ltd. (PPL)
2nd Author's Name Kazuyuki Sakiyama  
2nd Author's Affiliation Panasonic Co., Ltd. (Panasonic)
3rd Author's Name Toru Yamada  
3rd Author's Affiliation Panasonic Co., Ltd. (Panasonic)
4th Author's Name Toshihiko Taniguchi  
4th Author's Affiliation Panasonic Photo & Lighting Co., Ltd. (PPL)
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Speaker Author-1 
Date Time 2010-12-10 14:55:00 
Presentation Time 20 minutes 
Registration for EMCJ 
Paper # EMCJ2010-94 
Volume (vol) vol.110 
Number (no) no.332 
Page pp.75-80 
#Pages 6 
Date of Issue 2010-12-03 (EMCJ) 

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